0.1, 0.5, 1.0, and 5.0 % Eu-doped YVO4 single crystals were fabricated to assess photoluminescence (PL) and scintillation properties. The powder X-ray diffraction patterns of all the fabricated samples were the same as that of reference, and a single-phase structure of YVO4 was observed. The emission peaks owing to the 4f-4f transitions of Eu3+ ions were observed at 590, 605, 615, 620, and 695 nm in PL and scintillation spectra. Based on the pulse height spectra, Eu-doped samples had the light yield of 28,000 (0.1 % Eu), 33,000 (0.5 % Eu), 42,000 (1.0 % Eu), and 37,000 (5.0 % Eu) photons/MeV. In afterglow profiles, the afterglow level of 0.1, 0.5, 1.0, and 5.0 % Eu-doped samples was 58.1, 61.1, 49.1, and 35.6 ppm.