Y-cut Quartz Plate Research Articles

A Refracting Interferometer for Examining Modes of Vibration in Quartz Plates

A more sensitive method for observing longitudinal modes in vibrating piezoelectric plates consists in measuring the changes in the optical path presented by these plates to a beam of light. This is simply and conveniently accomplished by placing the transparent piezoelectric plate in one arm of a Michelson interferometer so that one of the interfering beams passes through the plate. Where a Michelson interferometer is not available, this may be accomplished in the case of a thin plate by means of the thick-film fringes formed by reflecting a beam of light from the two major surfaces of the plate. Changes in the optical path are dominated by the changes in the index of refraction of the vibrating plate. The variations of the index of refraction are markedly greater for the extraordinary ray of a light beam propagated along the Y-axis of a Y-cut quartz plate in which the compressional wave trains are propagated along the X-axis. Preliminary observations regarding the variation of the index of refraction in other crystal cuts are also presented. A brief summary is given of the longitudinal modes which have been observed in plates of quartz and tourmaline.

On the Piezoelectric Properties of Tourmaline

Oscillating piezoelectric plates of different frequencies have been made from California and South African Tourmaline. These plates have a frequency response of approximately 3770 kc per millimeter of thickness. The temperature coefficient for both specimens was found to be negative and is about 35.5 parts per million per degree centigrade for the African specimen and 38.1 parts per million per degree centigrade for the California crystal. Comparison of the tourmaline plates with a Y-cut quartz plate of the same size and frequency shows the tourmaline oscillators decidedly inferior on the basis of power output.