In this study, the valent state, emission properties, and decay lifetime of Ce-doped yttrium aluminum garnet (Y3Al5O12, YAG) wafer have been probed using X-ray absorption (XAS), X-ray excited optical luminescence (XEOL), and time-resolved XEOL (TR-XEOL). The XAS spectrum demonstrates that Ce ions are in the trivalent state, and the XEOL spectrum exhibits typical 5 d1-4f1(2F5/2) and 5 d1-4f1(2F7/2) transitions of Ce3+ ions, with emission peaks at ∼528 nm and 582 nm, respectively. From the TR-XEOL measurements, the decay lifetimes of 5 d1-4f1(2F5/2) and 5 d1-4f1(2F7/2) transitions are about ∼90 ns and ∼100 ns, respectively. We found that the reabsorption effects will not only make the 5 d1-4f1(2F7/2) transitions have longer decay lifetime, but also the higher emission intensity. By comparison with photoluminescence (PL) and time-resolved PL using a pulsed laser at 375 nm, we found that the emission spectra and decay lifetime of Ce-doped YAG (111) wafer are different when using X-ray irradiation. The longer decay lifetime measured by TR-XEOL compared TR-PL are caused by high X-ray dose irradiation. In addition, high X-ray doses provided by the nano-focus X-ray beam will be influenced the emission behaviors of Ce-doped YAG (111) wafer. Which phenomena have been demonstrated by using time-dependent XEOL with irradiation for 10 h. These peculiar emission behaviors observed with a hard X-ray nanoprobe may be able to provide important information on quantum technologies and scintillators used in hard X-ray detectors.