X-ray Mirrors Research Articles

Subaperture moving strategy and related systematic errors in stitching interferometry of curved X-ray mirrors

Subaperture moving strategy and related systematic errors in stitching interferometry of curved X-ray mirrors

Unveiling the origin of XMM-Newton soft proton flares

Context. Low-energy (<300 keV) protons entering the field of view of XMM-Newton can scatter with the X-ray mirror surface and reach the focal plane. They are observed in the form of a sudden increase in the background level, the so-called soft proton flares, affecting up to 40% of the mission observing time. Soft protons can hardly be disentangled from true X-ray events and cannot be rejected on board. Aims. All future high throughput grazing incidence X-ray telescopes operating outside the radiation belts are potentially affected by soft proton-induced contamination that must be foreseen and limited since the design phase. In-flight XMM-Newton’s observations of soft protons represent a unique laboratory to validate and improve our understanding of their interaction with the mirror, optical filters, and X-ray instruments. At the same time, such models would link the observed background flares to the primary proton population encountered by the telescope, converting XMM-Newton into a monitor for soft protons. Methods. We built a Geant4 simulation of XMM-Newton, including a verified mass model of the X-ray mirror, the focal plane assembly, and the EPIC MOS and pn-CCDs. Analytical computations and, when available, laboratory measurements collected from literature were used to verify the correct modelling of the proton scattering and transmission to the detection plane. Similarly to the instrument X-ray response, we encoded the energy redistribution and proton transmission efficiency into a redistribution matrix file (RMF), mapping the probability that a proton from 2 to 300 keV is detected in a certain detector channel, and an auxiliary response file (ARF), storing the grasp towards protons. Both files were formatted according to the standard NASA calibration database and any compliant X-ray data analysis tool can be used to simulate or analyse soft proton-induced background spectra. An overall systematic uncertainty of 30% was assumed on the basis of the estimated accuracy of the mirror geometry and transmission models. Results. For the validation, three averaged soft proton spectra, one for each filter configuration, were extracted from a collection of 13 years of MOS observations of the focused non X-ray background and analysed with Xspec. A similar power-law distribution is found for the three filter configurations, plus black-body-like emission below tens of keV used as a correction factor, based on the dedicated spectral analysis of 55 in-flight proton flares presented in Paper II. The best-fit model is in agreement with the power-law distribution predicted from independent measurements for the XMM-Newton orbit, spent mostly in the magnetosheath and nearby regions. For the first time we are able to link detected soft proton flares with the proton radiation environment in the Earth’s magnetosphere, while proving the validity of the simulation chain in predicting the background of future missions. Benefiting from this work and contributions from the Athena instrument consortia, we also present the response files for the Athena mission and updated estimates for its focused charged background.

Unveiling the origin of XMM-Newton soft proton flares

Context. Low-energy (< 300 keV) protons entering the field of view of the XMM-Newton telescope scatter with the X-ray mirror surface and might reach the X-ray detectors on the focal plane. They manifest in the form of a sudden increase in the rates, usually referred to as soft proton flares. By knowing the conversion factor between the soft proton energy and the deposited charge on the detector, it is possible to derive the incoming flux and to study the environment of the Earth magnetosphere at different distances, given the wide and elliptical XMM-Newton orbit. Thanks to detailed Geant4 simulations, we were able to build specific soft proton response matrices for MOS and PN. Aims. In this second paper, we present the results of testing these matrices with real data for the first time, while also exploring the seasonal and solar activity effect on the proton environment. The selected spectra are relative to 55 simultaneous MOS and PN observations with flares raised in four different temporal windows: December-January and July-August of 2001-2002 (solar maximum) and 2019-2020 (solar minimum). Methods. We selected and extracted the flare mean spectra and count rates in the 2–11.5 keV energy range for the four epochs. After investigating the rate variations among the MOS1, MOS2, and PN instruments, we fit the X-ray spectra using XSPEC and the proton response matrices. The best-fitting parameters derived for the three instruments were compared in order to obtain the systematic errors. Results. There is no seasonal or solar activity effect on the soft proton mean count rates, but we find large discrepancies in the instrument cross-correlations across the 20 years of satellite operations. In 2001-2002, after a few years of operation, the MOS1 and MOS2 rates are similar, and about 20% with regard to the PN ones. After 20 years, PN does not present any variation in its response, while MOS1 suffers a reduction of ∼30%, in addition to the 30% loss due to the damage of two CCDs, and MOS2 is affected by an even worse degradation (70%). The main result of the spectral analysis is that the physical model representative of the proton spectra at the input of the telescope is a power law. However, a second and phenomenological component is necessary to take into account imprecision in the generation of the matrices at softer (< 5 keV) energies. This component contributes for 21% for the MOS and 5% for the PN to the total flux in the 2–5 keV energy range. Conclusions. This study, which is the first application of the soft proton response matrices to real data, shows coherent results between detectors and allows us to estimate systematic uncertainties in the measured spectra of 3% between the two MOS detectors and of 24% between MOS and PN, together with a systematic in the input flux of about a factor of two. They are all likely due to uncertainties in the proton transmission models, with the presence of additional passive material in front of the front-illuminated MOS, and element deposition on its electrode structure across the mission life. Dedicated studies and laboratory measurements are required for improving the accuracy of the proton response files.

Precision Manufacturing in China of Replication Mandrels for Ni-Based Monolithic Wolter-I X-ray Mirror Mandrels

The X-ray satellite “Einstein Probe” of the Chinese Academy of Sciences (CAS) was successfully launched on 9 January 2024 at 15:03 Beijing Time from the Xichang Satellite Launch Center in China with a “Long March-2C” rocket. The Einstein Probe is equipped with two scientific X-ray telescopes. One is the Wide-field X-ray Telescope (WXT), which uses lobster-eye optics. The other is the Follow-up X-ray Telescope (FXT), a Wolter-I type telescope. These telescopes are designed to study the universe for high-energy X-rays associated with transient high-energy phenomena. The FXT consists of two modules based on 54 thin X-ray Wolter-I grazing incidence Ni-replicated mirrors produced by the Italian Media Lario company, as contributions from the European Space Agency and the Max Planck Institute for Extraterrestrial Physics (MPE), which also provided the focal-plane detectors. Meanwhile, the Institute of High Energy Physics (IHEP), together with the Harbin Institute of Technology and Xi’an Institute of Optics and Precision Mechanics, has also completed the development and production of the structural and thermal model (STM), qualification model (QM) and flight model (FM) of FXT mirrors for the Einstein Probe (EP) satellites for demonstration purposes. This paper introduces the precision manufacturing adopted in China of Wolter-I X-ray mirror mandrels similar to those used for the EP-FXT payload. Moreover, the adopted electroformed nickel replication process, based on a chemical nickel–phosphorus alloy, is reported. The final results show that the surface of the produced mandrels after demolding and the internal surface of the mirrors have been super polished to the roughness level better than 0.3 nm RMS and the surface accuracy is better than 0.2 μm, and the mirror angular resolution for single mirror shells may be as good as 17.3 arcsec HPD (Half Power Diameter), 198 arcsec W90 (90% Energy Width) @1.49 keV (Al-K line). These results demonstrate the reliability and advancement of the process. As the first efficient X-ray-focusing optics manufacturing chain established in China, we successfully developed the first focusing mirror prototype that could be used for future X-ray satellite payloads.

Data quality in laboratory convergent-beam X-ray total scattering

Measurement of laboratory atomic pair distribution function data has improved with contemporary X-ray sources, optics and detectors, with acquisition times of the order of minutes for ideal samples. This paper examines resolution effects in pair distribution function data obtained using a convergent-beam configuration and an Ag X-ray tube from standard silicon powder and from 10 nm BaTiO3 nanocubes. The elliptical multilayer X-ray mirror reflects a non-trivial X-ray spectrum and introduces resolution effects not commonly treated in ordinary parafocusing divergent-beam laboratory diffraction. These resolution effects are modeled using the fundamental parameters approach, and the influence this has on interpretation and modeling of the resulting reduced atomic pair distribution function data is demonstrated.

Error analysis model-driven workflow for self-calibration stitching testing of X-ray flat surfaces

Self-calibration stitching test is widely utilized for testing X-ray flat surfaces. Various factors, including environment disturbances, motion errors, misalignments, overlapping ratios, and sub-aperture sizes can affect the accuracy. Previous studies have shown that motion errors can introduce slope errors in the test surface, and higher overlapping ratios can increase the test error. However, these error analyses have not been comprehensive or quantitatively sufficient for practical applications. For X-ray flat surfaces with specific accuracy requirements, the necessary control levels for error sources and the optimal test parameters remain unclear. To this end, an error analysis model-driven workflow for self-calibration stitching testing of X-ray flat surfaces is proposed. This model allows for the systematic evaluation of how different error sources and test parameters affect test accuracy. Further, it can guide the determination of the control levels of error sources and test parameters, moving beyond the reliance on empirical experience as seen in previous studies. A flat X-ray mirror with clear aperture of 250 mm × 30 mm and 0.2 nm (50 nrad) RMS accuracy requirement was utilized to demonstrate the procedures of the workflow. Verification experiments demonstrated that this workflow can serve as a standard model for evaluating test accuracy and guiding test procedures to achieve the desired accuracy in self-calibration stitching of X-ray flat mirrors.

Методы монохроматизации синхротронного излучения (обзор исследований)

The paper presents an analysis of studies related to the monochromatization of X-ray radiation (XR) at synchrotron radiation sources. A review of monochromators based on of X-ray diffraction on crystals is given, and the peculiarities of their technical realization are considered. The ideas about monochromators which include multilayer structures are examined. The authors also study technical problems arising during designing devices and its possible solutions. Introduction. The possibilities of using X-rays in scientific research are described. The high efficiency of synchrotron radiation sources is noted, and its characterization is given. Elementary information about diffraction of X-rays. The paper describes the properties of X-ray radiation and the possibilities of its using while studying various materials. Degree of monochromaticity. The degree of monochromaticity is an important characteristic of the synchrotron radiation (SR). Depending on the width of the wavelength band, “white”, “pink” and monochromatic beams are distinguished. Monochromators based on multilayer structures are used to obtain “pink” beams. Monochromatic radiation is formed using monocrystals. When conducting experiments with “white” beams, the monochromator is not used. The authors also describe the factors that violate the ideal fulfillment of the Wolf-Bragg condition and affect the degree of monochromaticity (heat, vibration). The reflectivity values at different beam grazing angles are noted to have different widths. Monochromators based on multilayer structures. Periodic structures combining thin layers of two heterogeneous materials make it possible to obtain “pink” beams. The wavelength bandwidth of such devices is one or two orders of magnitude greater than that of monochromators using crystals as optical elements. Configurations and geometry of optical elements. There are two types of X-ray diffraction on a crystal: Bragg and Laue diffraction. Bragg diffraction refers to reflective geometry, Laue diffraction is based on the passage of beams through the crystal. The section provides examples of monochromators with different configurations of crystals and X-ray mirrors. The arrangement of optical elements in a monochromator plays an important role in the geometry of the beam path. When designing monochromators, it is necessary to take into account the methods of fixation and orientation of the rotation axes of optical elements. Examples of monochromators with different configurations of crystals and X-ray mirrors are given. Focusing monochromators. It is possible to provide sagittal and meridional types of deformation by bending the optical element of the monochromator. Due to the curved crystal surface the beam is not only monochromatized but also subjected to focusing. Modern focusing monochromators are equipped with adaptivity elements allowing it to change the radius of curvature of the optical element. Examples of practical realization of such monochromators are presented. Thermal load of SR on optical elements. The SR is characterized by high brightness and a wide spectrum of emitted wavelengths. While operating optical elements of SR stations absorb a large amount of thermal power. The problems of heat dissipation have a fundamental influence on the quality of synchrotron radiation monochromatization. Additional information about monochromators. Examples of special design solutions for monochromators are given. Conclusion. The design of monochromators is relevant to the synchrotron radiation source 4+ “SKIF” under construction in Novosibirsk.

Testing the optical components for the National Ignition Facility time-resolved soft x-ray opacity spectrometer (OpSpecTR).

Opacity measurements are being carried out at the Z-facility at Sandia National Laboratories and at the National Ignition Facility (NIF) at Lawrence Livermore National Laboratory. The current soft x-ray Opacity Spectrometer (OpSpec) used on the NIF uses two elliptically bent crystals in time-integrated mode on either an image plate or a film. Plans are under way to expand these opacity measurements into a mode of time-resolved detection, called OpSpecTR. Previously, considerations for the available hCMOS detector size and photometrics led to a crystal geometry redesign and the use of a grazing angle x-ray mirror. The mirror acts as a low-pass x-ray energy filter, reducing the contribution of higher energy x rays. The first tests of the mirror and the crystal for OpSpecTR are presented here. The size of the mirror reflection and the reflectivity is tested using a Manson x-ray source. The mirror coupled with the new elliptical crystal shape demonstrates OpSpecTR's spectral coverage. The results from the x-ray optics performance testing are shown along with the intended design.

First-principles approach to x-ray active optics: design and verification.

This paper presents the first-principles design approach for x-ray active optics. The feature of deterministic modulation enables the simulation-modulation cycle in place of the measurement-modulation feedback loops used in traditional active optics. We apply an x-ray mirror with localized thermal elastic deformation to validate the idea. Our experiments have demonstrated that the new active optics have the potential to outperform the accuracy of surface shape metrology instruments.

The diamond-silicon carbide composite Skeleton® as a promising material for substrates of intense X-ray beam optics.

The paper considers the possibility of using the diamond-silicon carbide composite Skeleton® with a technological coating of polycrystalline silicon as a substrate for X-ray mirrors used with powerful synchrotron radiation sources (third+ and fourth generation). Samples were studied after polishing to provide the following surface parameters: root-mean-square flatness ≃ 50 nm, micro-roughness on the frame 2 µm × 2 µm σ ≃ 0.15 nm. The heat capacity, thermal conductivity and coefficient of linear thermal expansion were investigated. For comparison, a monocrystalline silicon sample was studied under the same conditions using the same methods. The value of the coefficient of linear thermal expansion turned out to be higher than that of monocrystalline silicon and amounted to 4.3 × 10-6 K-1, and the values of thermal conductivity (5.0 W cm-1 K-1) and heat capacity (1.2 J K-1 g-1) also exceeded the values for Si. Thermally induced deformations of both Skeleton® and monocrystalline silicon samples under irradiation with a CO2 laser beam have also been experimentally studied. Taking into account the obtained thermophysical constants, the calculation of thermally induced deformation under irradiation with hard (20 keV) X-rays showed almost three times less deformation of the Skeleton® sample than of the monocrystalline silicon sample.

Controlling cantilevered adaptive X-ray mirrors.

Modeling the behavior of a prototype cantilevered X-ray adaptive mirror (held from one end) demonstrates its potential for use on high-performance X-ray beamlines. Similar adaptive mirrors are used on X-ray beamlines to compensate optical aberrations, control wavefronts and tune mirror focal distances at will. Controlled by 1D arrays of piezoceramic actuators, these glancing-incidence mirrors can provide nanometre-scale surface shape adjustment capabilities. However, significant engineering challenges remain for mounting them with low distortion and low environmental sensitivity. Finite-element analysis is used to predict the micron-scale full actuation surface shape from each channel and then linear modeling is applied to investigate the mirrors' ability to reach target profiles. Using either uniform or arbitrary spatial weighting, actuator voltages are optimized using a Moore-Penrose matrix inverse, or pseudoinverse, revealing a spatial dependence on the shape fitting with increasing fidelity farther from the mount.

Multi-dimensional error figuring model for ion beams in X-ray mirrors

X-ray mirrors are core optical elements in synchrotron light sources, which are typically figured by ion beams. However, traditional ion beam figuring (IBF) methods cannot effectively correct both the height and 2D slope errors. Thus, what we believe to be a novel multi-dimensional error figuring model (MEFM) is proposed to integrate the height and 2D slope errors into a linear system of equations for simultaneous multi-dimensional error convergence. The weight values are determined based on specific manufacturing errors. The simulation results show that MEFM can achieve lower 2D slope and height errors than a single height or 2D slope errors in the figuring method. The power spectral density (PSD) curves before and after simulated figuring demonstrate that the low- and mid-frequency errors are corrected simultaneously. Figuring experiments on a 270 mm × 15 mm X-ray reflector showed that the height and 2D slope errors effectively converged. The results of the PSD curves indicate that MEFM is more effective than the traditional height figuring model in correcting mid-frequency errors, which further proves the validity of the solution model. This study provides an algorithmic reference for the IBF of ultra-high precision X-ray reflectors, thereby promoting the development of physics, medicine, materials, and other fields.

Sub-nanometre quality X-ray mirrors created using ion beam figuring.

Ion beam figuring (IBF) is a powerful technique for figure correction of X-ray mirrors to a high accuracy. Here, recent technical advancements in the IBF instrument developed at Diamond Light Source are presented and experimental results for figuring of X-ray mirrors are given. The IBF system is equipped with a stable DC gridded ion source (120 mm diameter), a four-axis motion stage to manipulate the optic, a Faraday cup to monitor the ion-beam current, and a camera for alignment. A novel laser speckle angular measurement instrument also provides on-board metrology. To demonstrate the IBF system's capabilities, two silicon X-ray mirrors were processed. For 1D correction, a height error of 0.08 nm r.m.s. and a slope error of 44 nrad r.m.s. were achieved. For 2D correction over a 67 mm × 17 mm clear aperture, a height error of 0.8 nm r.m.s.and a slope error of 230 nrad r.m.s. were obtained. For the 1D case, this optical quality is comparable with the highest-grade, commercially available, X-ray optics.

Emission of quasi-monochromatic ultrasoft X-ray of multilayer target in the Bragg direction under 5.7 MeV electron irradiation

Previously, it was experimentally shown that VUV radiation generated in a periodic structure of a multilayer X-ray mirror by relativistic electrons exhibits a quasi-monochromatic spectrum depending on the angle of inclination of the target and the direction of emission of radiation inside the radiation cone. Here, we present new experimental results regarding the properties of angular density of radiation. A comparison between the measured radiation intensity over a wide range of target inclination angles and theoretical calculations is provided.

Optimization of Cr/Sc-based multilayer mirrors for water window soft x-rays.

The development of efficient multilayer mirrors for the water window (a spectral region between absorption edges of carbon and oxygen, from 284 to 543 eV) remains a challenge. As the best candidate, the Cr/Sc multilayer provides maximum theoretical reflectivity of about 60% at near-normal incidence around the Sc L2,3 absorption edge (397 eV). However, the maximum measured peak reflectance published so far just slightly exceeds 20%. We report on a new (to the best of our knowledge) approach to design more efficient Cr/Sc-based multilayer coatings using the process of nitridation of chromium during deposition and adding boron carbide as a third material in the multilayer structure. We discuss our strategy of optimization of the CrN/B4C/Sc multilayer system based on experimental studies. The peak reflectance as high as 32% at 396 eV was measured with this type of coating, which is of main interest for various water window applications such as x-ray microscopy.

Soft X-ray wavefront sensing at an ellipsoidal mirror shell

A reliable `in situ' method for wavefront sensing in the soft X-ray domain is reported, developed for the characterization of rotationally symmetric optical elements, like an ellipsoidal mirror shell. In a laboratory setup, the mirror sample is irradiated by an electron-excited (4.4 keV), micrometre-sized (∼2 µm) fluorescence source (carbon K α, 277 eV). Substantially, the three-dimensional intensity distribution I(r) is recorded by a CCD camera (2048 × 512 pixels of 13.5 µm) at two positions along the optical axis, symmetrically displaced by ±21–25% from the focus. The transport-of-intensity equation is interpreted in a geometrical sense from plane to plane and implemented as a ray tracing code, to retrieve the phase Φ(r) from the radial intensity gradient on a sub-pixel scale. For reasons of statistical reliability, five intra-/extra-focal CCD image pairs are evaluated and averaged to an annular two-dimensional map of the wavefront error {\cal W}. In units of the test wavelength (C K α), an r.m.s. value \sigma_{\cal{W}} = ±10.9λ0 and a peak-to-valley amplitude of ±31.3λ0 are obtained. By means of the wavefront, the focus is first reconstructed with a result for its diameter of 38.4 µm, close to the direct experimental observation of 39.4 µm (FWHM). Secondly, figure and slope errors of the ellipsoid are characterized with an average of ±1.14 µm and ±8.8 arcsec (r.m.s.), respectively, the latter in reasonable agreement with the measured focal intensity distribution. The findings enable, amongst others, the precise alignment of axisymmetric X-ray mirrors or the design of a wavefront corrector for high-resolution X-ray science.

Dispersion Elements for X-ray Mirror Spectrometer on a Range of 7–30 nm

Dispersion Elements for X-ray Mirror Spectrometer on a Range of 7–30 nm

Characterization of a HPHT boron ion-implanted diamond X-ray mirror following high vacuum annealing

The incorporation of boron into a diamond lattice holds the potential to advance X-ray optics, offering the capability to manipulate various parameters of the lattice. This includes enhancing near-infrared absorption relative to pure diamond, thereby enabling Q-switchable optics. The use of MeV boron implantation emerges as a promising method for precisely doping the diamond lattice. However, for these optics to function effectively as Bragg-reflecting mirrors, ion implantation must be executed with meticulous attention to maintaining a strain-free, perfect diamond lattice. This study aimed to investigate the feasibility of utilizing a 9 MeV ion beam for high energy boron implantation. Different areas of a high-pressure, high-temperature (HPHT) diamond sample were subjected to irradiation with 9 MeV Boron ions, ranging in fluences from 5×1015 to 2.5×1016ions/cm2. Following boron implantation, high-temperature vacuum annealing was performed to restore the diamond lattice. Our assessment utilized X-ray rocking curve imaging, surface profilometry, and micro-Raman spectroscopy, with additional observations on near-infrared transmission properties. Our measurement of high-quality Bragg reflection through X-ray rocking curve imaging, sensitive to implantation-induced strain and defects, served as an key diagnostic for the effectiveness of this ion-implanted sample as a Bragg-reflecting optic.

Ion beam figuring for X-ray mirrors: history, state-of-the-art and future prospects.

Synchrotron light sources require X-ray optics with extremely demanding accuracy for the surface profile, with less than 100 nrad slope errors and sub-nanometre height errors. Such errors are challenging to achieve for aspheres using traditional polishing methods. However, post-polishing error correction can be performed using techniques such as ion beam figuring (IBF) to improve optics to the desired quality. This work presents a brief overview of the history of IBF, introduces some of the challenges for obtaining such demanding figure errors, and highlights the work done at several in-house IBF facilities at synchrotron light sources worldwide to obtain state-of-the-art optical quality.

Multistrip multilayer mirrors for sources based on inverse Compton scattering

A technique has been developed for calculating the periods of multi-strip multilayer mirrors for effective use with sources based on the inverse Compton effect. A model for constructing the multi-strip mirror is presented. The model has been developed in accordance with modern capabilities for creating multilayer X-ray mirrors. The reflection coefficients and fractions of the energy emitted by the source that are reflected are compared for total external reflection, for multilayer Goebel mirrors and for multi-strip mirrors. It is shown that the multi-strip design of multilayer mirrors proposed in the work is almost an order of magnitude superior to Goebel mirrors and to mirrors based on the total external reflection effect in terms of the efficiency of use of the source energy.