Waviness Profile Research Articles

Why filtering surface profiles?

This position paper is to discuss the problems of assessing microgeometrical deviations at surfaces of geometrically defined bodies. The new ISO 4287:1996 defines a lot of parameters for the 2D-assessment of three different types of profiles, the primary profile, the roughness profile and the waviness profile. Concerning the microtopography, the standardized procedures of electrical filtering for separating roughness and waviness are a convention which was derived from the possibilities of the computer-aided evaluation of profiles, which does not necessarily refer to process and functional properties. To reduce the again proliferated number of parameters by the edition of the above-mentioned standard, it is proposed to omit the electrical filtering and to evaluate the primary profile with its superimposed roughness and waviness within the evaluation length lp only. In this case, lp is used as sampling length filter. The practicability and usefulness of this proposal are discussed, also regarding the increasing 3D-evaluation of surfaces to be expected. Concerning the amplitude parameters to be used for assessing, tolerancing and process supervising, the application of parameters based on a statistical consideration of the amplitude density curve is recommended.

Light scattering patterns of simulated engineering surfaces when the surfaces have a sinusoidal waviness

Waviness induced changes in light scattering patterns were numerically analyzed for several simulated engineering surfaces. The analyses were based upon the light scattering theory developed by Beckmann. In order to simplify the analyses, three sinusoidal waveforms of the same frequency but of three different amplitudes were selected as waviness profiles.

Interferogram analysis using a Fourier transform method for automatic 3D surface measurement

A Fourier transform method of interference pattern analysis is a powerful tool for automatic phase measurements. The technique is free from errors caused by high-frequency disturbances and the variation of background intensity. The method is particularly useful for waviness and roughness profile reconstruction of 3D surfaces.

上下振動の影響を受けない高精度粗さ測定法 (第2報)

When one will measure the precision profiles of super smooth surfaces using an optical interferometer, a perfect-flat reference mirror should be used. However, it is impossible to obtain such a mirror. For the case using a stylus method, a perfectly-straight-moving slide table should be used. It is impossible to obtain that table too. In this paper, We propose the optical precision profiling method which does not need a perfect-flat plane. This method is developed on the optical skid method previously reported (the 1st report). For the surface data obtained using the optical skid method, the amplitude of low spatial-frequency components were attenuated noticeably and the data were used as the roughness profiles. This paper will make it clear that : (1) One can theoretically calculate the exact attenuation rate of frequency component from the positions and the sizes of the photo-detectors used in the sensor head of the optical skid method. (2) One can completely retrieve the surface profile by the digital filtering using the calculated attenuation rate. In an experiment, a profile of a step height standard is retrieved using the method mentioned above. And a waviness profile of a mirror obtained using this method is compared with the profile measured using Talystep.

Closure to “Discussion of ‘The Proficorder—An Instrument for Recording Waviness and Other Surface Profiles’” (1948, Trans. ASME, 70, pp. 269–270)

Closure to “Discussion of ‘The Proficorder—An Instrument for Recording Waviness and Other Surface Profiles’” (1948, Trans. ASME, 70, pp. 269–270)

The Proficorder—An Instrument for Recording Waviness and Other Surface Profiles

Abstract The Proficorder described in this paper represents a major addition to available surface-measuring instruments. It provides data which are highly essential in the study of surfaces and the processes by which they are obtained. Its function is to reproduce, with appropriate magnifications, the actual profile of a considerable length of surface. It permits the study of individual irregularities as to size, shape, and relative position with respect to other irregularities. The instrument can be used to good advantage for inspection of production setups for waves and other surface characteristics. As an instrument for use in process engineering, it provides quantitative data for determining the effectiveness of steps taken to improve or obtain certain surface finishes in machining or grinding operations. As a laboratory instrument, the Proficorder supplies indispensable information to all those who are interested in determining the causes, effects, and characteristics of surface irregularities.