Vibration Modes Of Cantilever Research Articles

Molecular dynamics simulation of bimodal atomic force microscopy

Bimodal atomic force microscopy (AFM) is an important branch of multi-frequency AFM, which can simultaneously obtain the surface morphology and properties of samples. However, the atomic-scale phenomena in the vibration process of bimodal AFM have not been observed due to the absence of atomic-scale model. In this paper, the molecular dynamics (MD) simulations are used to model bimodal AFM. A double springs oscillator model is used to describe the first two vibration mode of the AFM cantilever. By applying dual-frequencies excitation, the dynamics of the model tip and the tip–substrate interactions are observed. The amplitude, phase shift and the average force change of the tip obtained in the simulation were found to be consistent with the continuum simulation results. The effect of different amplitude ratios on the vibration response of the tip is analyzed and validated by experiments. This novel model makes it possible to simulate two vibration modes of cantilever at atomic scale in bimodal AFM.

Effect of surface stress induced curvature on the eigenfrequencies of microcantilever plates

Ultrasensitive physical, chemical and biological sensors have emerged in the last decade based on the measurement of the eigenfrequencies of micro- and nanosized cantilever plates. Surface stress is omnipresent in these devices due to a variety of factors such as the fabrication process, temperature variations and analyte adsorption. How surface stress influences on the eigenfrequencies of cantilever plates has remained as an unsolved question in physics that has raised a long debate since first experiments in 1975. Recent theoretical models have shed light on the role of the net surface stress. Still, there exists a discrepancy between theory and some experimental reports, affecting to the capability for quantification of these sensors. In this Letter, we present a theoretical framework that demonstrates that the cantilever bending due to differential surface stress between opposite faces of the cantilever, a neglected effect in classical beam theory, plays a relevant role in the stiffness and eigenfrequencies of cantilevers. We develop a new theoretical framework that provides analytical equations that accurately describe the effect of surface stress on the first three vibration modes of cantilevers. Our findings provide the final piece of the puzzle for solving this long-standing problem in physics.

Imaging using lateral bending modes of atomic force microscope cantilevers

Using scanning probe techniques, surface properties such as shear stiffness and friction can be measured with a resolution in the nanometer range. The torsional deflection or buckling of atomic force microscope cantilevers has previously been used in order to measure the lateral forces acting on the tip. This letter shows that the flexural vibration modes of cantilevers oscillating in their width direction parallel to the sample surface can also be used for imaging. These lateral cantilever modes exhibit vertical deflection amplitudes if the cantilever is asymmetric in thickness direction, e.g., by a trapezoidal cross section.