The validity of the decremental unloading (stress dip) technique for measuring the internal stress was carefully examined for Cu, Ti, and Fe polycrystals at 77 – 650 K. For Ti and Fe the critical stress, σ c, for zero relaxation depended on the relaxation time after dipping and generally showed a higher temperature dependence than the modulus. Besides, in the b.c.c. and h.c.p. metals in which the thermally-activated barries such as the Peierls hills or short range obstacles due to interstitial impurity atoms are high enough, the relaxation curves after dipping to within a certain stress level exhibited a transition from negative-to-positive relaxation. At temperatures below about 300 K, the critical stress, σ c∞, at which the time for the transition from negative-to-positive relaxation was very large, was in accord with the internal stress, σ μ , obtained from the usual stress relaxation and back-extrapolation techniques, and exhibited the same temperature dependence as the shear modulus. At higher temperatures, σ c∞ was smaller than σ μ . It is concluded that in this higher temperature regime the dislocation structure changes during unloading and relaxation so that the dip technique, which requires a long relaxation time, is not as reliable for measuring the internal stress. In this temperature region, the stress which first yielded negative relaxation at the very beginning of the relaxation curve was in accord with the internal stress obtained by the back-extrapolation technique.