The use of X-ray fluorescence for the surface analysis of museum objects has been described by numerous authors. (1, 2, 3, 4) Some problems of the technique, such as the lack of homogeneity in alloys and the effects of surface configuration on quantitative results have been discussed. For quantitative analysis it is considered essential that all samples and standards in a given analysis be equivalent with respect to effective specimen area in shape, dimensions, orientation, inclination to the primary and secondary beams, distance from the X-ray tube and detector, and surface contour. The first two factors, size and shape of effective specimen area, can be handled by the choice of appropriate specimen masks or apertures. The other factors of inclination to the beams, distance from X-ray tube and detector, and surface configuration are extremely difficult to hold constant when analyzing non-flat objects, yet each affects the intensity of the beam reaching the detector. Failure to keep these factors constant from sample to sample will result in variations in intensity which are not related to composition.
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