Lead ferrite Pb2Fe2O5 (PFO) is a potential multiferroic material due its exhibition of ferroelectric and ferromagnetic properties. The effects of the substitution with nickel and synthesis temperature on the structural, morphological, and ferroelectric properties of lead ferrite thin films were investigated through the use of reactive magnetron sputtering deposition. Nickel loading concentrations were systematically varied (3%, 5%, and 10% by wt.%). X-ray diffraction analysis confirmed the formation of Ni-substituted distorted PFO lattices, while scanning electron microscopy and energy-dispersive spectroscopy indicated a uniform elemental distribution and surface morphology. Polarization vs. electrical field (P−E) measurements showed improved remnant polarization (Pr) with increasing Ni content and synthesis temperatures, achieving a maximum Pr of 66.7 µC/cm2 at 5 wt.% The Ni loading and substrate (Pt/Ti/SiO2/Si, Nanoshel Company, Cheshire, UK) temperature were 600 °C. These findings suggest that optimizing the synthesis parameters such as temperature and substitution content is crucial for controlling the ferroelectric properties of PFO thin films.
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