Uncoated Fiber Probes Research Articles

Collection of propagating electromagnetic fields by uncoated probe

Understanding light-matter interaction at the nanoscale by observation of fine details of electromagnetic fields is achieved by bringing nanoscale probes into the nearfield of light sources, capturing information that is lost in the far field. Although metal coated probes are often used for nearfield microscopy, they strongly perturb the electromagnetic fields under study. Here, through experiment and simulation, we detail light collection by uncoated fiber probes, which minimize such perturbation. Second-harmonic light from intensely-irradiated sub-wavelength sub-surface features was imaged to avoid otherwise dominating fundamental light background, yielding clear nearfield details through a 50 nm aperture uncoated probe with ∼23 nm optical resolution. Simulations show how a metallic coating distorts optical nearfields and limits optical coupling into the probe in comparison to an uncoated probe.

Direct observation of surface plasmon vortex and subwavelength focusing with arbitrarily-tailored intensity patterns

Surface plasmon (SP) vortices typically have annular intensity patterns. Here we show that fractional SP vortices with arbitrary, asymmetric intensity patterns can be synthesized via simple geometric arrangements. We provide the direct experimental observations over the existence of fractional SP vortices. Triangular SP vortex intensities are synthesized by circularly polarized plane waves. On the other hand, subwavelength focusing with user-desired patterns is also experimentally demonstrated. The synthesized SP vortex and focusing patterns are experimentally measured using a near-field scanning optical microscope with uncoated fiber probe and are found in good agreements as compared to numerical results.

Vectorial modeling of near-field imaging with uncoated fiber probes: transfer function and resolving power

Using exact 3D vectorial simulations of radiation coupling into uncoated dielectric fiber probes, we calculate amplitude transfer functions for conical single-mode fiber tips at the light wavelength of 633 nm. The coupling efficiency of glass fiber tips is determined in a wide range of spatial frequencies of the incident radiation for opening angles varying from 30 degrees to 120 degrees . The resolution in near-field imaging with these tips is considered for field distributions limited in both direct and spatial-frequency space. The characteristics of the transfer functions describing the relation between probed optical fields and near-field images are analyzed in detail. The importance of utilizing a perfectly sharp tip is also examined.

Propagation of femtosecond optical pulses through uncoated and metal-coated near-field fiber probes

The spatiotemporal evolution of a 10-femtosecond light pulse (λ=805 nm) propagating through uncoated and metal-coated near-field fiber probes is analyzed theoretically within a two-dimensional model for s and p polarization of the incident field. Internal reflection inside uncoated fiber probes (cone angle of 28°) results in an efficient guiding towards the fiber tip and a diffraction-limited spatial resolution of about 260 nm≈λ/3 in case of s polarization. While the transmission through uncoated fiber probes has negligible effects on the temporal and spectral pulse profile, strong modifications are observed for metal-coated aperture probes. The wavelength-dependent aperture transmission gives rise to a pronounced blueshift and spectral narrowing of the transmitted pulses.

Resolution enhancement in a reflection mode near-field optical microscope by second-harmonic modulation signals

The motion of the probe tip in a near-field scanning optical microscope, dithered by vibration of a tuning fork, can modulate the reflection signal from the sample surface not only at the fundamental dithering frequency but also at its second harmonic. By lock-in amplification of these modulated signals, enhanced optical images are obtained, even with an uncoated fiber probe. In particular, accurate optical images with higher resolution are obtained when the second-harmonic signal is detected, which results from the parametric modulation of the tip-sample separation at the double frequency of the horizontal dithering motion of the tip. Using a DVD ROM with a track pitch of 0.74 mum as a test sample, we observed that the sharp edges around the pits are clearly resolved with the second-harmonic signals and obtained enhanced resolution of ~70 nm full width at half-maximum.

Sub-wavelength imaging by depolarization in a reflection near-field optical microscope using an uncoated fiber probe

We present a reflection scanning near-field optical microscope utilizing counter-directional light propagation in an uncoated fiber probe, cross-polarized detection and shear-force feedback. Topographical and near-field optical imaging with a scanning speed of up to 10 μm/s and a lateral resolution better than 40 nm are demonstrated with a latex projection test sample. Determination of the optical resolution as well as correlation between topographical and near-field optical images are discussed.

Room-Temperature Near-Field Reflection Spectroscopy of Single Quantum Wells

We report on a novel optical near-field technique to measure the local polarizability of a topographically flat sample with a spatial resolution better than 100 nm. Using an uncoated fiber probe, we implement a cross-polarization detection of the optical signal at the fiber dither frequency. This technique suppresses efficiently the otherwise dominating far-field background and reduces topographic artifacts. We demonstrate its performance on a thin, strained near-surface CdS/ZnS single quantum well at room temperature. The optical structure of these topographically flat samples is due to CdS thickness fluctuations, and is observed to be uncorrelated within the spatial resolution of the instrument.

Oxidation of hydrogen-passivated silicon surfaces by scanning near-field optical lithography using uncoated and aluminum-coated fiber probes

Optically induced oxidation of hydrogen-passivated silicon surfaces using a scanning near-field optical microscope was achieved with both uncoated and aluminum-coated fiber probes. Line scans on amorphous silicon using uncoated fiber probes display a three-peak profile after etching in potassium hydroxide. Numerical simulations of the electromagnetic field around the probe–sample interaction region are used to explain the experimental observations. With an aluminum-coated fiber probe, lines of 35 nm in width were transferred into the amorphous silicon layer.

Combined AFM and laser lithography on hydrogen-passivated amorphous silicon

We report a novel combination of AFM lithography and laser direct writing on hydrogen-passivated amorphous silicon surfaces to fabricate combined silicon milli-, micro- and nanostructures. Selective oxidation is performed by focusing a laser beam (λ=458 nm) on a hydrogen-terminated silicon surface, forming the millimetre-size contact pads for connection of nanometre-scale patterns. The nanostructures are made by electric-field-enhanced oxidation using a contact mode AFM equipped with a metal-coated tip. Both techniques are based on selective oxidation of hydrogen-passivated amorphous silicon, where the oxide is used as an etch mask in a single etch step. The lithographic process has also been demonstrated using a reflection mode scanning near-field optical microscope with an uncoated fiber probe.

Optical near-field lithography on hydrogen-passivated silicon surfaces

We report on a novel lithography technique for patterning of hydrogen-passivated amorphous silicon surfaces. A reflection mode scanning near-field optical microscope with uncoated fiber probes has been used to locally oxidize a thin amorphous silicon layer. Lines of 110 nm in width, induced by the optical near field, were observed after etching in potassium hydroxide. The uncoated fibers can also induce oxidation without light exposure, in a manner similar to an atomic force microscope, and linewidths of 50 nm have been achieved this way.