We utilize the conventional Z-scan technique to provide absolute measurements of third-order nonlinear refraction coefficients (n2) in the mid-wave infrared at 2 µm and 3.9 µm of common optical materials that have transparency windows spanning this regime. We study a variety of narrow band gap and wide band gap semiconductors, fluoride crystals (BaF2, CaF2, LiF, and MgF2) and optical glasses, and a series of chalcogenide glasses. The n2 is found to span on the order of ∼10-15 to ∼10-12 cm2/W for the semiconductors, ∼10-16 cm2/W for the fluoride crystals and glasses, and ∼10-14 to ∼10-13 cm2/W for the chalcogenides. The experimental results are compared to previous measurements of n2 conducted in the visible and near-infrared along with empirical and theoretical formulations.