It is well known that very high dv/dt and di/dt during the switching instant is the major high-frequency electromagnetic interference (EMI) source. This paper proposes an improved and simplified EMI-modeling method considering the insulated gate bipolar transistor switching-behavior model. The device turn-on and turn-off dynamics are investigated by dividing the nonlinear transition by several stages. The real device switching voltage and current are approximated by piecewise linear lines and expressed using multiple dv/dt and di/dt superposition. The derived EMI spectra suggest that the high-frequency noise is modeled with an acceptable accuracy. The proposed methodology is verified by experimental results using a dc-dc buck converter