Electronic components are often susceptible to deterioration by environmental effects. Several studies have been reported on atmospheric corrosion of electronic devices with focus on functionality, storage capacity, and their miniaturization. However, there is a lack of studies focused on identifying the components most susceptible to atmospheric corrosion, the corrosion products generated in them, and the possible variables that have a greater impact on deterioration. The present study is focused on linking the deterioration of electronic boards with temperature and humidity cycles. This was accomplished through accelerated tests inside an atmospheric chamber, where the concentrations of pollutant gases (NO2 and SO2) are kept constant. Each trapezoidal cycle within the accelerated tests equals one day of field exposure. The results show that the NO2 and SO2 gasses reduced the life of the electronic components by 49.8%. The SO2 gas was found to be the contaminant gas that most influenced the deterioration of electronic devices. Energy-dispersive spectroscopy (EDS) show the formation of CuSO4. The development of protective coating against these pollutant gasses could improve the operation of electronic components.
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