A 1.55μm low-temperature-grown GaAs (LT-GaAs) photodetector with a resonant-cavityenhanced structure was designed and fabricated. A LT-GaAs layer grown at 200°C was used as the absorption layer. Twenty- and fifteen-pair GaAs∕AlAs-distributed Bragg reflectors were grown as the bottom and top mirrors. A responsivity of 7.1mA∕W with a full width at half maximum of 4nm was obtained at 1.61μm. The dark current densities are 1.28×10−7A∕cm2 at the bias of 0V and 3.5×10−5A∕cm2 at the reverse bias of 4.0V. The transient response measurement showed that the photocarrier lifetime in LT-GaAs is 220fs.