TM-polarized Emission Research Articles

The dependence of light extraction improvement on optimized surface microstructure for AlGaN-based UVC-LEDs considering TM-polarized emission

In order to improve the light extraction of AlGaN-based short wavelength ultraviolet light emitting diodes (DUC-LEDs), a type of microstructure with high aspect ratio is introduced and optimized on the AlN substrate surface. And, particle swarm optimization (PSO) algorithm is used to inverse design of the surface microstructure to maximize the light extraction efficiency (LEE). Considering that the propagation characteristics of TM-polarized light are different from that of TE-polarized light, the optical field distribution and LEE is analyzed for the UVC-LEDs with different TE-polarized component when the optimized surface microstructure is applied. Furthermore, the preparation process tolerance of the high aspect ratio structure is discussed by calculating the LED's LEE when the structural deviation occurs or morphology changes. Simulation results show that, by using the optimized surface microstructure based on parabola cone array, the LEDs' LEE is increased from 4.4% to 8.7% and from 0.4% to 3.7% for TE-polarized and TM-polarized emission, respectively. In addition, it is demonstrated that the light extraction improvement by the surface microstructure has a good tolerance to the structural deviation and morphology. The results are significant for improving light extraction and realizing high efficient short wavelength AlGaN-based UVC-LEDs by designing surface microstructures.

In-depth insights into polarization-dependent light extraction mechanisms of AlGaN-based deep ultraviolet light-emitting diodes.

The AlGaN-based deep ultraviolet light-emitting diodes (DUV LEDs) dominated by transverse-magnetic (TM) polarized emission suffer from extremely poor light extraction efficiency (LEE) from their top surface, which severely limits the device performance. In this study, the underlying physics of polarization-dependent light extraction mechanisms of AlGaN-based DUV LEDs has been explored in depth via simple Monte Carlo ray-tracing simulations with Snell's law. It is especially worth noting that the structures of the p-type electron blocking layer (p-EBL) and multi-quantum wells (MQWs) have a significant impact on light extraction behavior, especially for TM-polarized emission. Thus, an artificial vertical escape channel (named GLRV) has been constructed to efficiently extract the TM-polarized light through the top surface, by adjusting the structures of the p-EBL, MQWs, sidewalls, and using the adverse total internal reflection in a positive manner. The results show that the enhancement times of the top-surface LEE is up to 18 for TM-polarized emission in the 300 × 300 µm2 chip comprising a single GLRV structure, and further increases to 25 by dividing this single GLRV structure into a 4 × 4 micro-GLRV array structure. This study provides a new perspective for understanding and modulating the extraction mechanisms of polarized light to overcome the inherently poor LEE for the TM-polarized light.

Inverse Tapered AlGaN Micropillar and Nanowire LEDs for Improved Light Extraction Efficiency at 270 nm

Deep-ultraviolet (DUV) light emitting diodes (LEDs) show great potential in a wide range of applications, but suffer from poor external quantum efficiencies (EQEs) when compared to visible LEDs, due to their exceptionally poor light extraction efficiency (η <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">EXT</sub> ). One successful method of improving the η <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">EXT</sub> of DUV LEDs is the use of micropillar and nanowire arrays. Our previous works have reported the development of an “inverse taper” profile in AlGaN micropillars during wet etching in heated hydroxyl-based chemistries. Here, we study the effects of inverse tapering on the η <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">EXT</sub> of AlGaN microstructures and nanostructures at 270 nm using finite-difference time-domain simulations, in accordance with our experimental results. Results show that η <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">EXT</sub> can be increased from ∼45% to more than 95% for TM-polarized emission in microstructures with diameters of 1 μm and heights >1 μm, and from ∼35% to more than 85% for TE-polarized emission by an inverse taper angle of 5 °. Results for nanostructures also indicate significant η <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">EXT</sub> improvements through tuning of the inverse taper angle. These findings, along with our demonstration of inverse tapered high Al-content AlGaN micro and nanostructures, could enable the development of record-high EQE DUV LEDs based on arrays of high aspect ratio structures with high η <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">EXT</sub> .

High-Power, High-Efficiency Red Laser Diode Structures Grown on GaAs and GaAsP Metamorphic Superlattices

Three types of GaAsP metamorphic buffer layers, including linearly graded, step graded, and metamorphic superlattices, were compared for the purposes of virtual substrates for red laser diode heterostructures. Laser diodes were fabricated on GaAs substrates and relaxed GaAsP metamorphic superlattice virtual substrates. A laser diode structure with a tensile-strained quantum well on a standard miscut GaAs substrate achieved TM-polarized emission at a 638 nm wavelength with 45% peak power conversion efficiency (PCE) at a 880 mW continuous wave (CW) output power with T0 = 77 K and T1 = 266 K. An analogous laser diode structure with a compressively strained quantum well on the metamorphic superlattice emitted TE-polarized 639 nm light with 35.5% peak PCE at 880 mW CW with T0 = 90 K and T1 = 300 K.

Effect of surface plasmon coupling with radiating dipole on the polarization characteristics of AlGaN-based light-emitting diodes

The optical polarization characteristics of surface plasmon (SP) coupled AlGaN-based light emitting diodes (LEDs) are investigated theoretically by analyzing the radiation recombination process and scattering process respectively. For the Al0.5Ga0.5N/Al/Al2O3 slab structure, the relative intensity of TE-polarized and TM-polarized spontaneous emission (SE) rate into the SP mode obviously depends on the thickness of the Al layer. The calculation results show that TM dominated emission will be transformed into TE dominated emission with the decrease of the Al thickness, while the emission intensities of both TE/TM polarizations will decrease significantly. In addition, compared with TM polarized emission, TE polarized emission is easier to be extracted by SP coupling. For the Al0.5Ga0.5N/Al nano-particle structure, the ratio of transmittance for TE/TM polarized emission can reach ∼ 3.06, while for the Al free structure, it is only 1.2. Thus, the degree of polarization of SP coupled LED can be improved by the reasonable structural design.

Interplay between various active regions and the interband transition for AlGaN-based deep-ultraviolet light-emitting diodes to enable a reduced TM-polarized emission

Al-rich AlGaN-based deep-ultraviolet light-emitting diodes (DUV LEDs) have a low light extraction efficiency, especially when the emission wavelength is shorter than 280 nm, and this is partially because of the dominant transverse-magnetic polarized light. Our results show that the transverse-electric (TE) polarized light can be obtained even if the emission wavelength becomes even shorter by reducing the quantum well thickness. The ultrathin quantum well enables the enhanced TE-polarized emission that arises from the redistributed subbands for holes. On the contrary to the common belief, we observe a blueshift for the emission wavelength when the AlN composition in the quantum barrier increases. The internal quantum efficiency (IQE) for DUV LEDs with ultrathin quantum wells is no longer determined by the quantum-confined Stark effect, while quantum barrier with high AlN composition is vitally important to improve the electron injection efficiency and thus enhance the IQE.

Substrate dependence of TM-polarized light emission characteristics of BAlGaN/AlN quantum wells

To study the substrate dependence of light emission characteristics of transverse-magnetic (TM)-polarized light emitted from BAlGaN/AlN quantum wells (QWs) grown on GaN and AlN substrates were investigated theoretically. It is found that the topmost valence subband for QW structures grown on AlN substrate, is heavy hole state (HH1) while that for QW structures grown on GaN substrate is crystal-field split off light hole state (CL1), irrespective of the boron content. Since TM-polarized light emission is associated with the light hole state, the TM-polarized emission peak of BAlGaN/AlN QW structures grown on GaN substrate is expected to be much larger than that of the QW structure grown on AlN substrate. Also, both QW structures show that the spontaneous emission peak of BAlGaN/AlN QW structures would be improved with the inclusion of the boron. However, it rapidly begins to decrease when the boron content exceeds a critical value.

Surface plasmon coupling for suppressing p-GaN absorption and TM-polarized emission in a deep-UV light-emitting diode.

The radiated power enhancement (suppression) of an in- (out-of-) plane-oriented radiating dipole at a desired emission wavelength in the deep-ultraviolet (UV) range when it is coupled with a surface plasmon (SP) resonance mode induced on a nearby Al nanoparticle (NP) is demonstrated. Also, it is found that the enhanced radiated power propagates mainly in the direction from the Al NP toward the dipole. Such SP coupling behaviors can be used for suppressing the transverse-magnetic (TM)-polarized emission, enhancing the transverse-electric-polarized emission, and reducing the UV absorption of the p-GaN layer in an AlGaN-based deep-UV light-emitting diode by embedding a sphere-like Al NP in its p-AlGaN layer.

Demonstration of transverse-magnetic deep-ultraviolet stimulated emission from AlGaN multiple-quantum-well lasers grown on a sapphire substrate

We demonstrate transverse-magnetic (TM) dominant deep-ultraviolet (DUV) stimulated emission from photo-pumped AlGaN multiple-quantum-well lasers grown pseudomorphically on an AlN/sapphire template by means of photoluminescence at room temperature. The TM-dominant stimulated emission was observed at wavelengths of 239, 242, and 243 nm with low thresholds of 280, 250, and 290 kW/cm2, respectively. In particular, the lasing wavelength of 239 nm is shorter compared to other reports for AlGaN lasers grown on foreign substrates including sapphire and SiC. The peak wavelength difference between the transverse-electric (TE)-polarized emission and TM-polarized emission was approximately zero for the lasers in this study, indicating the crossover of crystal-field split-off hole and heavy-hole valence bands. The rapid variation of polarization between TE- and TM-dominance versus the change in lasing wavelength from 243 to 249 nm can be attributed to a dramatic change in the TE-to-TM gain coefficient ratio for the sapphire-based DUV lasers in the vicinity of TE-TM switch.

Experimental investigation of factors limiting slow axis beam quality in 9xx nm high power broad area diode lasers

GaAs-based broad-area diode lasers are needed with improved lateral beam parameter product (BPPlat) at high power. An experimental study of the factors limiting BPPlat is therefore presented, using extreme double-asymmetric (EDAS) vertical structures emitting at 910 nm. Continuous wave, pulsed and polarization-resolved measurements are presented and compared to thermal simulation. The importance of thermal and packaging-induced effects is determined by comparing junction -up and -down devices. Process factors are clarified by comparing diodes with and without index-guiding trenches. We show that in all cases studied, BPPlat is limited by a non-thermal BPP ground-level and a thermal BPP, which depends linearly on self-heating. Measurements as a function of pulse width confirm that self-heating rather than bias-level dominates. Diodes without trenches show low BPP ground-level, and a thermal BPP which depends strongly on mounting, due to changes in the temperature profile. The additional lateral guiding in diodes with trenches strongly increases the BPP ground-level, but optically isolates the stripe from the device edges, suppressing the influence of the thermal profile, leading to a BPP-slope that is low and independent of mounting. Trenches are also shown to initiate strain fields that cause parasitic TM-polarized emission with large BPPlat, whose influence on total BPPlat remains small, provided the overall polarization purity is &amp;gt;95%.

Lasing of TM modes in a two-dimensional GaAs microlaser.

We fabricated and tested an unstrained GaAs single-quantum-well microlaser which has a two-dimensional cavity shape known as the Penrose unilluminable room. The cavity exhibits quasi-one-dimensional modes, namely axial, diamond-shaped, and V-shaped modes. In contrast to previous observations of TE-polarized emission in GaAs microlasers, we observed TM-polarized emission. We explain this observation as being the result of lasing of the diamond-shaped modes whose incident angle at the cavity interface is very close to the Brewster angle.