Tip Oscillation Research Articles

Turbulent drag reduction through oscillating discs

AbstractThe changes in a turbulent channel flow subjected to sinusoidal oscillations of wall flush-mounted rigid discs are studied by means of direct numerical simulations (DNS). The Reynolds number is ${Re}_{\tau }=180$, based on the friction velocity of the stationary-wall case and the half-channel height. The primary effect of the wall forcing is the sustained reduction of wall-shear stress, which reaches a maximum of 20 %. A parametric study on the disc diameter, maximum tip velocity, and oscillation period is presented, with the aim of identifying the optimal parameters which guarantee maximum drag reduction and maximum net energy saving, the latter computed by taking into account the power spent to actuate the discs. This may be positive and reaches 6 %. The Rosenblat viscous pump flow, namely the laminar flow induced by sinusoidal in-plane oscillations of an infinite disc beneath a quiescent fluid, is used to predict accurately the power spent for disc motion in the fully developed turbulent channel flow case and to estimate localized and transient regions over the disc surface subjected to the turbulent regenerative braking effect, for which the wall turbulence exerts work on the discs. The Fukagata–Iwamoto–Kasagi identity is employed effectively to show that the wall-friction reduction is due to two distinguished effects. One effect is linked to the direct shearing action of the near-wall oscillating-disc boundary layer on the wall turbulence, which causes the attenuation of the turbulent Reynolds stresses. The other effect is due to the additional disc-flow Reynolds stresses produced by the streamwise-elongated structures which form between discs and modulate slowly in time. The contribution to drag reduction due to turbulent Reynolds stress attenuation depends on the penetration thickness of the disc-flow boundary layer, while the contribution due to the elongated structures scales linearly with a simple function of the maximum tip velocity and oscillation period for the largest disc diameter tested, a result suggested by the Rosenblat flow solution. A brief discussion on the future applicability of the oscillating-disc technique is also presented.

The role of surface corrugation and tip oscillation in single-molecule manipulation with a non-contact atomic force microscope.

Scanning probe microscopy (SPM) plays an important role in the investigation of molecular adsorption. The possibility to probe the molecule–surface interaction while tuning its strength through SPM tip-induced single-molecule manipulation has particularly promising potential to yield new insights. We recently reported experiments, in which 3,4,9,10-perylene-tetracarboxylic-dianhydride (PTCDA) molecules were lifted with a qPlus-sensor and analyzed these experiments by using force-field simulations. Irrespective of the good agreement between the experiment and those simulations, systematic inconsistencies remained that we attribute to effects omitted from the initial model. Here we develop a more realistic simulation of single-molecule manipulation by non-contact AFM that includes the atomic surface corrugation, the tip elasticity, and the tip oscillation amplitude. In short, we simulate a full tip oscillation cycle at each step of the manipulation process and calculate the frequency shift by solving the equation of motion of the tip. The new model correctly reproduces previously unexplained key features of the experiment, and facilitates a better understanding of the mechanics of single-molecular junctions. Our simulations reveal that the surface corrugation adds a positive frequency shift to the measurement that generates an apparent repulsive force. Furthermore, we demonstrate that the scatter observed in the experimental data points is related to the sliding of the molecule across the surface.

Dynamic magnetic imaging by alternating force magnetic force mmicroscopy

Recently, magnetic force microscope (MFM) for dynamic imaging of AC magnetic field has attracted considerable attention due to its potential applications and special requirements in industry. In this paper, we develop an alternating force MFM technique based on the frequency modulation of MFM tip oscillation, which provides a powerful tool for the development of key technologies in magnetic information storage industry. Different from conventional MFM, the main points of the present work are: 1) the investigation of the frequency-modulation phenomenon; 2) optimization of the MFM tip parameter, and introduction of the MFM signal processing apparatus; 3) observation of the AC magnetic field. For dynamic evaluation of AC magnetic field, we need to theoretically analyze the mechanical and magnetic properties of MFM tips, to technically develop the MFM signal processing apparatus, and to experimentally image the dynamic magnetic signals. Finally, we demonstrate the alternating force MFM technique, which can measure and analyze the nano-scale magnetic domain structures in advanced magnetic materials.

Anharmonicity, solvation forces, and resolution in atomic force microscopy at the solid-liquid interface

Solid-liquid interfaces are central to nanoscale science and technology and control processes as diverse as self-assembly, heterogeneous catalysis, wetting, electrochemistry, or protein function. Experimentally, measuring the structure and dynamics of solid-liquid interfaces with molecular resolution remains a challenge. This task can, in principle, be achieved with atomic force microscopy (AFM), which functions locally, and with nanometer precision. When operated dynamically and at small amplitudes, AFM can provide molecular-level images of the liquid solvation layers at the interfaces. At larger amplitudes, results in the field of multifrequency AFM have shown that anharmonicities in the tip motion can provide quantitative information about the solid's mechanical properties. The two approaches probe opposite aspects of the interface and are generally seen as distinct. Here it is shown that, for amplitudes A<d, the thickness of the solvation region, the tip mainly probes the interfacial liquid, and subnanometer resolution can be achieved through solvation forces. For A>d, the tip trajectory becomes rapidly anharmonic due to the tip tapping the solid, and the resolution decreases. A nonlinear transition between the two regimes occurs for A~d and can be quantified with the second harmonic of the tip oscillation. These results, confirmed by computer simulations, remain valid in most experimental conditions. Significantly, they provide an objective criterion to enhance resolution and to decide whether the results are dominated by the properties of the solid or of the liquid.

Contact stiffness modulation in contact-mode atomic force microscopy

The effect of fast contact stiffness modulation on the frequency response in contact-mode atomic force microscopy is studied analytically near primary resonance. Based on the Hertzian contact theory, a lumped single degree of freedom oscillator is considered for modeling the contact-mode dynamics between the tip of the microbeam and the sample. Averaging method and perturbation analysis are performed to obtain the modulation equations of the slow dynamic. The influence of the contact stiffness modulation on the non-linear characteristic of the frequency response is examined. We find that the amplitude of the contact stiffness modulation influences significantly the amplitude of the tip oscillation as well as the shift direction of the frequency response indicating that such a modulation can be used to characterize the local elastic properties of the sample. Comparison between the analytical predictions and the numerical simulations is given and application to a real atomic force microscope example is provided.

Sensorless enhancement of an atomic force microscope micro-cantilever quality factor using piezoelectric shunt control

The image quality and resolution of the Atomic Force Microscope (AFM) operating in tapping mode is dependent on the quality (Q) factor of the sensing micro-cantilever. Increasing the cantilever Q factor improves image resolution and reduces the risk of sample and cantilever damage. Active piezoelectric shunt control is introduced in this work as a new technique for modifying the Q factor of a piezoelectric self-actuating AFM micro-cantilever. An active impedance is placed in series with the tip oscillation voltage source to modify the mechanical dynamics of the cantilever. The benefit of using this control technique is that it removes the optical displacement sensor from the Q control feedback loop to reduce measurement noise in the loop and allows for a reduction in instrument size.

Imaging of Au nanoparticles deeply buried in polymer matrix by various atomic force microscopy techniques

Recently, some papers reported successful imaging of subsurface features using atomic force microscopy (AFM). Some theoretical studies have also been presented, however the imaging mechanisms are not fully understood yet. In the preceeding papers, imaging of deeply buried nanometer-scale features has been successful only if they were buried in a soft matrix. In this paper, subsurface features (Au nanoparticles) buried in a soft polymer matrix were visualized. To elucidate the imaging mechanisms, various AFM techniques; heterodyne force microscopy, ultrasonic atomic force microscopy (UAFM), 2nd-harmonic UAFM and force modulation microscopy (FMM) were employed. The particles buried under 960 nm from the surface were successfully visualized which has never been achieved. The results elucidated that it is important for subsurface imaging to choose a cantilever with a suitable stiffness range for a matrix. In case of using the most suitable cantilever, the nanoparticles were visualized using every technique shown above except for FMM. The experimental results suggest that the subsurface features buried in a soft matrix with a depth of at least 1 µm can affect the local viscoelasticity (mainly viscosity) detected as the variation of the amplitude and phase of the tip oscillation on the surface. This phenomenon presumably makes it possible to visualize such deeply buried nanometer-scale features in a soft matrix.

Quantitative analysis of the magnetic domain structure in polycrystalline La0.7Sr0.3MnO3thin films by magnetic force microscopy

The nanoscale magnetic domain structure of the polycrystalline La(0.7)Sr(0.3)MnO(3) granular thin films was imaged with a developed magnetic force microscopy technique by simultaneously detecting both the perpendicular and in-plane components of magnetic field gradients during the same scan of the tip oscillation. The characteristics of both the perpendicular and in-plane magnetic field gradient at the grain edges or the nonmagnetic grain boundary phase for LSMO films were demonstrated and can be used to evaluate the magnetic domain structure and magnetic isolation between neighboring grains. A two dimensional signal transformation algorithm to reconstruct the in-plane magnetization distribution of the polycrystalline LSMO thin films from the measured raw MFM images with the aid of the deconvolution technique was presented. The comparison between the experimental and simulated MFM images indicates that the magnetic grains or clusters are in the single domain (SD) or multi-domain (MD) state with the magnetic moments parallel or anti-parallel to the effective magnetic field of each grain, possibly due to the need for minimizing the total energy. The quantitative interpretation of the magnetic domain structure indicates that the large magnetoresistance in the studied LSMO films is mainly due to tunnel effect and scattering of conducted electrons at the nonmagnetic grain boundary phase related to the different configurations of magnetic domain states between neighboring grains.

Tip-Induced Deformation of Graphene on SiO2 Assessed by Capacitance Measurement

Tip-induced deformation of graphene on a SiO2 substrate was probed through a combination of scanning capacitance microscopy (SCM) and dynamic force microscopy (DFM). Spectroscopic analysis revealed that the resonant frequency shift (Δf) of the probe tip oscillation and the modulated capacitance (ΔC) simultaneously measured on graphene depend on the externally applied bias voltage while keeping the tip–sample distance constant. This finding is interpreted as a result of a local displacement of the graphene surface caused by the electrostatic force between the probe tip and graphene. The approach curve of the SCM tip toward graphene can be used to calibrate the observed ΔC spectra, quantitatively yielding an average deformation of approximately 0.31 nm in trilayer graphene and 0.21 nm in single-layer graphene.

On the dynamics of tapping mode atomic force microscope probes

A mathematical model is developed to investigate the grazing dynamics of tapping mode atomic force microscopes (AFM) subjected to a base harmonic excitation. A multimode Galerkin approximation is utilized to discretize the nonlinear partial differential equation of motion governing the cantilever response and associated boundary conditions and obtain a set of nonlinearly coupled ordinary differential equations governing the time evolution of the system dynamics. A comprehensive numerical analysis is performed for a wide range of the excitation amplitude and frequency. The tip oscillations are examined using nonlinear dynamic tools through several examples. The non-smoothness in the tip/sample interaction model is treated rigorously. A higher-mode Galerkin analysis indicates that period doubling bifurcations and chaotic vibrations are possible in tapping mode microscopy for certain operating parameters. It is also found that a single-mode Galerkin approximation, which accurately predicts the tip nonlinear responses far from the sample, is not adequate for predicting all of the nonlinear phenomena exhibited by an AFM, such as grazing bifurcations, and leads to both quantitative and qualitative errors.

Multiscale approach for simulations of Kelvin probe force microscopy with atomic resolution

The distance dependence and atomic-scale contrast recently observed in nominal contact potential difference (CPD) signals simultaneously recorded by Kelvin probe force microscopy (KPFM) using noncontact atomic force microscopy (NCAFM) on defect-free surfaces of insulating as well as semiconducting samples have stimulated theoretical attempts to explain such effects. Especially in the case of insulators, it is not quite clear how the applied bias voltage affects electrostatic forces acting on the atomic scale. We attack this problem in two steps. First, the electrostatics of the macroscopic tip-cantilever-sample system is treated by a finite-difference method on an adjustable nonuniform mesh. Then the resulting electric field under the tip apex is inserted into a series of atomistic wavelet-based density functional theory (DFT) calculations. Results are shown for a realistic neutral but reactive silicon nanoscale tip interacting with a NaCl(001) sample. Bias-dependent forces and resulting atomic displacements are computed to within an unprecedented accuracy. Theoretical expressions for amplitude modulation (AM) and frequency modulation (FM) KPFM signals and for the corresponding local contact potential differences (LCPD) are obtained by combining the macroscopic and atomistic contributions to the electrostatic force component generated at the voltage modulation frequency, and evaluated for several tip oscillation amplitudes $A$ up to 10 nm. For $A$ $=$ 0.1 \AA{}, the computed LCPD contrast is proportional to the slope of the atomistic force versus bias in the AM mode and to its derivative with respect to the tip-sample separation in the FM mode. Being essentially constant over a few volts, this slope is the basic quantity that determines variations of the atomic-scale LCPD contrast. Already above $A$ $=$ 1 \AA{}, the LCPD contrasts in both modes exhibit almost the same spatial dependence as the slope. In the AM mode, this contrast is approximately proportional to ${A}^{\ensuremath{-}1/2}$, but remains much weaker than the contrast in the FM mode, which drops somewhat faster as $A$ is increased. These trends are a consequence of the macroscopic contributions to the KPFM signal, which are stronger in the AM-mode and especially important if the sample is an insulator even at subnanometer separations where atomic-scale contrast appears.

Characterisation of bone following ultrasonic cutting

Ultrasonic surgery is an increasingly popular technique for cutting bone, but little research has investigated how the ultrasonic tip oscillations may affect the cuts they produce in bone. The aim of this investigation was to evaluate the oscillation and cutting characteristics of an ultrasonic surgical device. A Piezosurgery 3 (Mectron, Carasco, Italy) ultrasonic cutting system was utilised with an OP3 style tip. The system was operated with the tip in contact with porcine bone samples (loads of 50 to 200g) mounted at 45° to the vertical insert tip and with a water flow of 57ml/min. Tip oscillation amplitude was determined using scanning laser vibrometry. Bone surfaces defects were characterised using laser profilometry and scanning electron microscopy. A positive relationship was observed between the magnitude of tip oscillations and the dimensions of defects cut into the bone surface. Overloading the tip led to a reduction in oscillation and hence in the defect produced. A contact load of 150g provided the greatest depth of cut. Defects produced in the bone came from two clear phases of cutting. The structure of the bone was found to be an important factor in the cut characteristics following piezosurgery. Cutting of bone with ultrasonics is influenced by the load applied and the setting used. Care must be used to prevent the tip from sliding over the bone at low loadings.

Electrical Potential of Acupuncture Points: Use of a Noncontact Scanning Kelvin Probe

Objective. Acupuncture points are reportedly distinguishable by their electrical properties. However, confounders arising from skin-to-electrode contact used in traditional electrodermal methods have contributed to controversies over this claim. The Scanning Kelvin Probe is a state-of-the-art device that measures electrical potential without actually touching the skin and is thus capable of overcoming these confounding effects. In this study, we evaluated the electrical potential profiles of acupoints LI-4 and PC-6 and their adjacent controls. We hypothesize that acupuncture point sites are associated with increased variability in potential compared to adjacent control sites. Methods. Twelve healthy individuals were recruited for this study. Acupuncture points LI-4 and PC-6 and their adjacent controls were assessed. A 2 mm probe tip was placed over the predetermined skin site and adjusted to a tip-to-sample distance of 1.0 mm under tip oscillation settings of 62.4 Hz frequency. A 6 × 6 surface potential scan spanning a 1.0 cm × 1.0 cm area was obtained. Results. At both the PC-6 and LI-4 sites, no significant differences in mean potential were observed compared to their respective controls (Wilcoxon rank-sum test, P = 0.73 and 0.79, resp.). However, the LI-4 site was associated with significant increase in variability compared to its control as denoted by standard deviation and range (P = 0.002 and 0.0005, resp.). At the PC-6 site, no statistical differences in variability were observed. Conclusion. Acupuncture points may be associated with increased variability in electrical potential.

“Magnetic Force Microscopy and Energy Loss Imaging of Superparamagnetic Iron Oxide Nanoparticles”

We present quantitative, high spatially resolved magnetic force microscopy imaging of samples based on 11 nm diameter superparamagnetic iron oxide nanoparticles in air at room temperature. By a proper combination of the cantilever resonance frequency shift, oscillation amplitude and phase lag we obtain the tip-sample interaction maps in terms of force gradient and energy dissipation. These physical quantities are evaluated in the frame of a tip-particle magnetic interaction model also including the tip oscillation amplitude. Magnetic nanoparticles are characterized both in bare form, after deposition on a flat substrate, and as magnetically assembled fillers in a polymer matrix, in the form of nanowires. The latter approach makes it possible to reveal the magnetic texture in a composite sample independently of the surface topography.

$Q$ Control of an Atomic Force Microscope Microcantilever: A Sensorless Approach

The scan rate and image resolution of the atomic force microscope (AFM) operating in tapping-mode may be im proved by modifying the quality (Q) factor of the AFM micro cantilever according to the sample type and imaging environment. Piezoelectric shunt control is a new method of controlling the Q factor of a piezoelectric self-actuating AFM microcantilever. The mechanical damping of the microcantilever is controlled by an electrical impedance placed in series with the tip oscillation circuit. A synthetic impedance was designed to allow easy modification of the control parameters which may vary with environmental conditions. The proposed techniques are experimentally demonstrated to reduce the Q factor of an AFM microcantilever from 297.6 to 35.5. AFM images obtained using this method show significant improvement in both scan rate and image quality.

A universal piezo-driven ultrasonic cell microinjection system

Over the past decade, the rapid development of biotechnologies such as gene injection, in-vitro fertilization, intracytoplasmic sperm injection (ICSI) and drug development have led to great demand for highly automated, high precision equipment for microinjection. Recently a new cell injection technology using piezo-driven pipettes with a very small mercury column was proposed and successfully applied in ICSI to a variety of mammal species. Although this technique significantly improves the survival rates of the ICSI process, shortcomings due to the toxicity of mercury and damage to the cell membrane due to large lateral tip oscillations of the injector pipette may limit its application. In this paper, a new cell injection system for automatic batch injection of suspended cells is developed. A new design of the piezo-driven cell injector is proposed for automated suspended cell injection. This new piezo-driven cell injector design relocates the piezo oscillation actuator to the injector pipette which eliminates the vibration effect on other parts of the micromanipulator. A small piezo stack is sufficient to perform the cell injection process. Harmful lateral tip oscillations of the injector pipette are reduced substantially without the use of a mercury column. Furthermore, ultrasonic vibration micro-dissection (UVM) theory is utilized to analyze the piezo-driven cell injection process, and the source of the lateral oscillations of the injector pipette is investigated. From preliminary experiments of cell injection of a large number of zebrafish embryos (n = 200), the injector pipette can easily pierce through the cell membrane at a low injection speed and almost no deformation of the cell wall, and with a high success rate(96%) and survival rate(80.7%) This new injection approach shows good potential for precision injection with less damage to the injected cells.

BOptimizing atomic force microscopy for characterization of diamond-protein interfaces

Atomic force microscopy (AFM) in contact mode and tapping mode is employed for high resolution studies of soft organic molecules (fetal bovine serum proteins) on hard inorganic diamond substrates in solution and air. Various effects in morphology and phase measurements related to the cantilever spring constant, amplitude of tip oscillations, surface approach, tip shape and condition are demonstrated and discussed based on the proposed schematic models. We show that both diamond and proteins can be mechanically modified by Si AFM cantilever. We propose how to choose suitable cantilever type, optimize scanning parameters, recognize and minimize various artifacts, and obtain reliable AFM data both in solution and in air to reveal microscopic characteristics of protein-diamond interfaces. We also suggest that monocrystalline diamond is well defined substrate that can be applicable for fundamental studies of molecules on surfaces in general.

Piezoelectric driven non-toxic injector for automated cell manipulation.

Stimulated by state-of-the-art robotic and computer technology, Intra Cytoplasmic Sperm Injection (ICSI) automation aims to scale and seamlessly transfer the human hand movements into more precise and fast movements of the micro manipulator. Piezo-drill cell injection, a novel technique using piezo-driven pipettes with a very small mercury column, has significantly improves the survival rates of ICSI process. It is found that complications are due, in large part, to toxicity of mercury and the damage to the cell membrane because of the lateral tip oscillations of injector pipette. In this paper, a new design of piezo-driven cell injector is proposed for automated suspended cell injection. This new piezo-driven cell injector design centralizes the piezo oscillation power on the injector pipette which eliminates the vibration effect on other parts of the micromanipulator. Detrimental lateral tip oscillations of the injector pipette are attenuated to a desirable level even without the help of mercury column. This mercury-free injector can sublime the piezoelectric driven injection technique to completely non-toxic level with great research and commercial application in gene injection, in-vitro fertilization, ICSI and drug development.

Sliding onset of nanoclusters: a new AFM-based approach

In the last twenty years the Atomic Force Microscope (AFM) is become one of the most important instruments to perform characterization at the nanoscale and to achieve direct control of nano-objects. In this paper a quantitative method to estimate the detachment energy of gold spherical nanoclusters with typical diameters of 13, 24 and 42 nm deposited on silicon dioxide and Highly Oriented Pyrolytic Graphite (HOPG) by AFM measures with Amplitude Modulation (AM-AFM) feedback is presented. It is based on the use of AFM tip oscillations to induce clusters detachments and on the substrate mapping with phase signal. With this powerful method is possible to move in a very controlled way nanoparticles selected by dimensions. All experiments have been performed in air conditions using a commercial AFM microscope with cantilevers characterized by nominal spring constants lying between 5 and 50 N/m.

Control of a Two-Axis Micromanipulator-Based Scanning Probe System for 2.5-D Nanometrology

This paper presents a versatile atomic-force-microscope (AFM)-based two-axis probing system for 2.5-D nanometrology. Central to this system is a two-axis compliant micromanipulator based on the AFM probe whose orientation and position can be actively changed in the scanning plane. Three enabling technologies are proposed to uniformly scan the section of the sample surface within this plane. First, an orientation control system is developed that controls the tip-orientation to track the changes in normal of the surface section. Second, tapping mode-based tip-sample interaction scheme is developed wherein the direction of tip oscillation and the peak force are controlled, according to the local orientation of the section. Third, a two-axis scanning scheme is developed wherein the scanning and interaction control axes are aligned along the tangent and normal to the local section. Taken together, these technologies enable the entire scanning process to conform to the geometry of the sample in the scanning plane and facilitate metrology of samples with large geometric variation along the two axes. In this paper, the developed probing system is used to scan the entire top surface of a micropipette and demonstrate greater access and absence of artifacts when compared to a conventional scan.