Time-resolved Cathodoluminescence Research Articles

Time-resolved cathodoluminescence measurement of the effects of α -particle-related damage on minority hole lifetime in free-standing n-GaN

Time-resolved cathodoluminescence using 30 keV ultrafast electron pulses has been used to perform direct measurements of the minority hole lifetime τh as a function of 3.7 MeV α-particle fluence in high-quality free-standing n-type GaN substrates. The lifetime damage factor K calculated from these measurements was found to monotonically decrease from 6.9 × 10−2 to 6.4 × 10−4 cm2 s−1 ion−1 with increasing α-fluence from 108 to 1012 cm−2, implying a reduction in trap cross section and/or an aggregation of α-induced traps. The small, ∼200–300 nm, hole diffusion length estimated from the minority hole lifetime for the highest α-fluence necessitates the deployment of α-voltaic device strategies and architectures that emphasize depletion and drift over diffusion for effective charge collection and optimal power conversion efficiency.

Investigating the exciton dynamics in InGaN/GaN core-shell nanorods using time-resolved cathodoluminescence.

This study examines the exciton dynamics in InGaN/GaN core-shell nanorods using time-resolved cathodoluminescence (TRCL), which provides nanometer-scale lateral spatial and tens of picoseconds temporal resolutions. The focus is on thick (>20 nm) InGaN layers on the non-polar, semi-polar and polar InGaN facets, which are accessible for study due to the unique nanorod geometry. Spectrally integrated TRCL decay transients reveal distinct recombination behaviours across these facets, indicating varied exciton lifetimes. By extracting fast and slow lifetime components and observing their temperature trends along with those of the integrated and peak intensity, the differences in behaviour were linked to variations in point defect density and the degree and density of localisation centres in the different regions. Further analysis shows that the non-polar and polar regions demonstrate increasing lifetimes with decreasing emission energy, attributed to an increase in the depth of localisation. The semi-polar facet instead showed a spectral independence of the lifetime which could not be rationalised by an absence of exciton localisation. This investigation provides insights into the intricate exciton dynamics in InGaN/GaN nanorods, offering valuable information for the design and development of optoelectronic devices.

Recent Developments in Time-Resolved Cathodoluminescence: Measuring Dynamics at the Nanoscale

Recent Developments in Time-Resolved Cathodoluminescence: Measuring Dynamics at the Nanoscale

A Femtosecond Electron-Based Versatile Microscopy for Visualizing Carrier Dynamics in Semiconductors Across Spatiotemporal and Energetic Domains.

Carrier dynamics detection in different dimensions (space, time, and energy) with high resolutions plays a pivotal role in the development of modern semiconductor devices, especially in low-dimensional, high-speed, and ultrasensitive devices. Here, a femtosecond electron-based versatile microscopy is reported that combines scanning ultrafast electron microscopy (SUEM) imaging and time-resolved cathodoluminescence (TRCL) detection, which allows for visualizing and decoupling different dynamic processes of carriers involved in surface and bulk in semiconductors with unprecedented spatiotemporal and energetic resolutions. The achieved spatial resolution is better than 10nm, and the temporal resolutions for SUEM imaging and TRCL detection are ≈500fs and ≈4.5ps, respectively, representing state-of-the-art performance. To demonstrate its unique capability, the surface and bulk carrier dynamics involved in n-type gallium arsenide (GaAs) are directly tracked and distinguished. It is revealed, in real time and space, that hot carrier cooling, defect trapping, and interband-/defect-assisted radiative recombination in the energy domain result in ordinal super-diffusion, localization, and sub-diffusion of carriers at the surface, elucidating the crucial role of surface states on carrier dynamics. The study not only gives a comprehensive physical picture of carrier dynamics in GaAs, but also provides a powerful platform for exploring complex carrier dynamics in semiconductors for promoting their device performance.

Impurity characterization in diamond for quantum and electronic applications: advances with time-resolved cathodoluminescence

The ultimate purity of synthetic diamond crystals is currently limited by traces of boron and nitrogen. Here we study diamond crystals grown at high-pressure high-temperature, which are made of 3D growth sectors with variable residual impurity contents. The boron concentration is found in the 0.5–6.4 ppb range thanks to continuous cathodoluminescence analysis. Time-resolved cathodoluminescence experiments complete the impurity analysis with measurements of free exciton lifetimes. From them, we deduced an estimate of the nitrogen concentration at the ppb level, from 0.6 to 30 ppb depending on the growth sectors. We identified n-type, p-type and highly compensated regions, which illustrates the potential of cathodoluminescence as a local characterization tool for qualifying diamond for electronic and quantum applications.

Fabrication and properties of novel multilayered Y3Al5O12/MgAl2O4 ceramics doped with rare-earth ions

Multilayer Y3Al5O12 (YAG)/MgAl2O4 (MAS) ceramics doped with europium and cerium ions exhibiting functionally graded properties was consolidated by the SPS method using during layer-by-layer formation powders approach. The optimal modes for YAG/MAS ceramics doped with rare earth ions preparation were obtained during the SPS process. It was observed that at the isothermal exposure stage at a temperature of 1450 °C shrinkage process stops. Introduction of CeO2, Eu2O3 into the YAG/MAS ceramics leads to a shift in the range of intense shrinkage to lower temperatures. Morphological, optical and luminescent properties have been studied in detail for fabricated YAG/MAS ceramics with different arrangement of the layers. The luminescent properties using time-resolved cathodoluminescence (CL) and steady state photoluminescence (PL) were investigated in detail. The spectral dynamics in nanosecond and millisecond time range was demonstrated after e-beam excitation. The PL efficiency of YAG/MAS ceramics and nature of luminescence centers were analyzed. The novel kind of YAG/MAS functional ceramics could be promising candidate for efficient luminescent converter.

Recent developments and future trends in time-resolved cathodoluminescence: Measuring dynamics at the nanoscale

Recent developments and future trends in time-resolved cathodoluminescence: Measuring dynamics at the nanoscale

Investigation of the Impact of Point Defects in InGaN/GaN Quantum Wells with High Dislocation Densities.

In this work, we report on the efficiency of single InGaN/GaN quantum wells (QWs) grown on thin (<1 µm) GaN buffer layers on silicon (111) substrates exhibiting very high threading dislocation (TD) densities. Despite this high defect density, we show that QW emission efficiency significantly increases upon the insertion of an In-containing underlayer, whose role is to prevent the introduction of point defects during the growth of InGaN QWs. Hence, we demonstrate that point defects play a key role in limiting InGaN QW efficiency, even in samples where their density (2-3 × 109 cm-2) is much lower than that of TD (2-3 × 1010 cm-2). Time-resolved photoluminescence and cathodoluminescence studies confirm the prevalence of point defects over TDs in QW efficiency. Interestingly, TD terminations lead to the formation of independent domains for carriers, thanks to V-pits and step bunching phenomena.

Synthesis and crystal and defect structures of polycrystalline Cu2SrSnS4 and Cu1.9SrSnS4 powders

The polycrystalline samples of Cu2 – δSrSnS4 with a trigonal structure were prepared by solid-phase ampoule synthesis with a long annealing time (1944 h), and their crystal lattice parameters were refined and Raman spectra were obtained. For the first time, the effect of defect structure on the lifetimes of photogenerated current carriers in the polycrystalline powders was examined by combining time-resolved microwave photoconductivity and cathodoluminescence methods. A significant increase in the lifetimes during the conversion of Cu2SrSnS4 into Cu1.9SrSnS4 was found, which was probably due to changes in the defect structure.

Core-Shell Nanorods as Ultraviolet Light-Emitting Diodes.

Existing barriers to efficient deep ultraviolet (UV) light-emitting diodes (LEDs) may be reduced or overcome by moving away from conventional planar growth and toward three-dimensional nanostructuring. Nanorods have the potential for enhanced doping, reduced dislocation densities, improved light extraction efficiency, and quantum wells free from the quantum-confined Stark effect. Here, we demonstrate a hybrid top-down/bottom-up approach to creating highly uniform AlGaN core-shell nanorods on sapphire repeatable on wafer scales. Our GaN-free design avoids self-absorption of the quantum well emission while preserving electrical functionality. The effective junctions formed by doping of both the n-type cores and p-type caps were studied using nanoprobing experiments, where we find low turn-on voltages, strongly rectifying behaviors and significant electron-beam-induced currents. Time-resolved cathodoluminescence measurements find short carrier liftetimes consistent with reduced polarization fields. Our results show nanostructuring to be a promising route to deep-UV-emitting LEDs, achievable using commercially compatible methods.

Radiation effects in ultra-thin GaAs solar cells

Ultra-thin solar cells are of significant interest for use in space due to their intrinsic radiation tolerance, which may allow them to be used in particularly harsh radiation environments, where thicker cells would degrade rapidly and enable reduction in cover glass thickness to reduce launch mass. In this study, devices with an 80 nm GaAs absorber layer were irradiated with 3 MeV protons. It is shown that integrated light management in these ultra-thin devices offers enhanced efficiency, in addition to extended lifetime through radiation resilience. Time-resolved cathodoluminescence is employed to map the introduction of radiation-induced defects with increasing proton fluence and characterize a decrease in carrier lifetime from 198 ± 5 ps pre-radiation to 6.2±0.6 ps, after irradiation to 2×1014 cm−2 fluence. Despite the substantial reduction in carrier lifetime, short-circuit current does not degrade up to a proton fluence of 1 × 1015 cm−2, beyond which a collapse in short-circuit current is observed. This exposure correlates with the point at which the carrier lifetime, extrapolated from cathodoluminescence, becomes comparable to the transit time for carriers to cross the ultra-thin device. Variation in current–voltage behavior with carrier lifetime and fluence shows that the recombination statistics are similar to those of a Shockley–Read–Hall single deep-level trap model, but that bimolecular recombination does not fully describe the observed behavior. An implication of these highly radiation tolerant cells for space power systems is shown to offer significant savings in cover glass mass, compared with a thicker cell.

From the synthesis of hBN crystals to their use as nanosheets in van der Waals heterostructures

In the wide world of 2D materials, hexagonal boron nitride (hBN) holds a special place due to its excellent characteristics. In addition to its thermal, chemical and mechanical stability, hBN demonstrates high thermal conductivity, low compressibility, and wide band gap around 6 eV, making it a promising candidate for many groundbreaking applications and more specifically in van der Waals heterostructures. Millimeters scale hBN crystals are obtained through a disruptive dual method (polymer derived ceramics (PDC)/pressure-controlled sintering (PCS)) consisting in a complementary coupling of the PDC route and a PCS process. In addition to their excellent chemical and crystalline quality, these crystals exhibit a free exciton lifetime of 0.43 ns, as determined by time-resolved cathodoluminescence measurements, confirming their interesting optical properties. To go further in applicative fields, hBN crystals are then exfoliated, and resulting boron nitride nanosheets (BNNSs) are used to encapsulate transition metal dichalcogenides (TMDs). Such van der Waals heterostructures are tested by optical spectroscopy. BNNSs do not luminesce in the emission spectral range of TMDs and the photoluminescence width of the exciton at 4 K is in the range 2–3 meV. All these results demonstrate that these BNNSs are of high quality and relevant for future opto-electronic applications.

AlGaN Microfins as Nonpolar UV Emitters Probed by Time-Resolved Cathodoluminescence

Despite the continuous technological progress and recent commercialization of UV light emitting diodes for sterilization and disinfection applications, the performance of solid-state UV emitters still lags far behind that of their InGaN-based counterparts, which emit in the visible blue–green spectrum. Both fundamental physical aspects and material quality restrictions have been discussed as origin of this striking difference. In this study, GaN/AlGaN core–shell microfins with a-plane sidewalls are proposed as a model system to demonstrate the efficiency potential of ultra-low-defect nonpolar UV emitters. Such structures are manufactured by bottom-up selective-area metalorganic vapor phase epitaxy of GaN microfin cores and further overgrowth of the AlGaN active region, employing a compositionally graded GaN/AlGaN short-period superlattice for strain management. Using this approach, mostly crack-free AlGaN quantum wells emitting around 321 nm could be realized with a threading dislocation density of as low as (6 ± 3) × 107 cm–2. The carrier dynamics within the nonpolar AlGaN structures are studied by time-resolved cathodoluminescence spectroscopy, revealing fast radiative recombination lifetimes down to 0.6 ns and distinct signatures of carrier localization at low temperatures. Delayed carrier emission from localized states within the cladding is proposed to be a cause for anomalously high effective carrier lifetimes observed at temperatures below 80 K. By analyzing the characteristic temperature dependence of radiative and nonradiative recombination processes and fitting the lifetime data with an appropriate model across the whole temperature range, a room-temperature internal quantum efficiency of (40 ± 6) % is estimated for the studied sample. The findings corroborate the interest in nonpolar AlGaN structures as highly efficient UV emitters.

Carrier dynamics at trench defects in InGaN/GaN quantum wells revealed by time-resolved cathodoluminescence.

Time-resolved cathodoluminescence offers new possibilities for the study of semiconductor nanostructures - including defects. The versatile combination of time, spatial, and spectral resolution of the technique can provide new insights into the physics of carrier recombination at the nanoscale. Here, we used power-dependent cathodoluminescence and temperature-dependent time-resolved cathodoluminescence to study the carrier dynamics at trench defects in InGaN quantum wells - a defect commonly found in III-nitride structures. The measurements show that the emission properties of trench defects closely relate to the depth of the related basal plane stacking fault within the quantum well stack. The study of the variation of carrier decay time with detection energy across the emission spectrum provides strong evidence supporting the hypothesis that strain relaxation of the quantum wells enclosed within the trench promotes efficient radiative recombination even in the presence of an increased indium content. This result shines light on previously reported peculiar emission properties of the defect, and illustrates the use of cathodoluminescence as a powerful adaptable tool for the study of defects in semiconductors.

Temperature dependence of cathodoluminescence emission in irradiated Si-doped β-Ga2O3

Temperature dependent continuous and time-resolved cathodoluminescence measurements were employed to understand the luminescence from Si-doped β-Ga2O3 prior to irradiation and after 10 MeV proton and 18 MeV alpha-particle irradiation. The shape and location of the luminescence components [ultraviolet luminescence (UVL′) at 3.63 eV, UVL at 3.3 eV, and blue-luminescence at 2.96 eV] obtained from Gaussian decomposition did not change in either width or peak location, indicating that new radiation-induced trap-levels were non-radiative in nature between the 4.5 and 310 K temperature range. Activation energies, associated with thermal quenching of UVL′ and UVL bands, show temperature dependence, suggesting ionization of shallow Si-donors and a thermally activated non-radiative process.

Spatially and Time-Resolved Carrier Dynamics in Core-Shell InGaN/GaN Multiple-Quantum Wells on GaN Wire.

Time-resolved cathodoluminescence is a key tool with high temporal and spatial resolution. However, optical spectroscopic information can be also extracted using synchrotron pulses in a hard X-ray nanoprobe, exploiting a phenomenon called X-ray excited optical luminescence. Here, with 20 ps time resolution and 80 nm lateral resolution, we applied this time-resolved X-ray microscopy technique to individual core-shell InGaN/GaN multiple quantum well heterostructures deposited on GaN wires. Our findings suggest that the m-plane related multiple quantum well states govern the carrier dynamics. Likewise, our observations support not only the influence of In incorporation in the recombination rates, but also carrier localization phenomena at the hexagon wire apex. In addition, our experiment calls for further investigations of the spatiotemporal domain on the underlying mechanisms of optoelectronic nanodevices. Its great potential becomes more valuable when time-resolved X-ray excited optical luminescence microscopy is used in operando with other methods, such as X-ray absorption spectroscopy.

Radiative lifetime of free excitons in hexagonal boron nitride

In a previous PRL, the authors found quantitative evidence that, despite hexagonal boron nitride ($h$-BN) having an indirect band gap, the luminescence efficiency of high-quality crystals reaches the level of the best direct semiconductors. Here, thanks to breakthrough experiments performed using an original time-resolved cathodoluminescence setup, the authors address the root cause of the high quantum yield luminescence efficiency. These results should have practical application for the use of $h$-BN in 2D materials based optoelectronic devices.

Luminescence properties and energy transfer processes in LiSrPO4 doped with Pr3+ and co-doped with Na+ and Mg2+

The paper studies the influence of co-doping with alkali metal ions (Na+, Mg2+) on fast interconfigurational 5d-4f luminescence in LiSrPO4 doped with Pr3+. Na+ and Mg2+ ions were introduced in order to provide charge compensation and modify the electronic configuration of the materials. Luminescent properties of the powder samples were investigated using time-resolved pulsed cathodoluminescence and luminescence spectroscopy in the UV-VUV spectral region. The obtained results were compared with those obtained earlier on LiSrPO4:Pr3+ without co-dopants. With introduction of the co-dopants, slight changes in relative luminescence intensity and decay time of Pr3+ ion 4f15d1-4f2 radiative transitions were found. The study revealed a complex interplay between defects of crystalline structure and impurity ions leading to the peculiarities in energy relaxation processes. Energy transfer leading to the delayed recombination processes is responsible for significant afterglow in Pr3+4f15d1-4f2 emission.

Time-resolved cathodoluminescence in an ultrafast transmission electron microscope

Ultrafast transmission electron microscopy (UTEM) combines sub-picosecond time-resolution with the versatility of TEM spectroscopies. It allows us to study the ultrafast materials' response using complementary techniques. However, until now, time-resolved cathodoluminescence was unavailable in UTEM. In this paper, we report time-resolved cathodoluminescence measurements in an ultrafast transmission electron microscope. We mapped the spatial variations of the emission dynamics from nano-diamonds with a high density of NV centers with a 12 nm spatial resolution and sub-nanosecond temporal resolution. This development will allow us to study the emission dynamics from quantum emitters with a unique spatiotemporal resolution and benefit from the wealth of complementary signals provided by transmission electron microscopes. It will further expand the possibilities of ultrafast transmission electron microscopes, paving the way to the investigation of the quantum aspects of an electron/sample interaction.

Time-resolved cathodoluminescence investigations of AlN:Ge/GaN nanowire structures

Light emitting diodes represent a key technology that can be found in many areas of everydays life. Therefore, the improvement of the efficiency of such structures offers a high economic and ecological potential. One approach is electrostatic screening of the quantum-confined Stark effect (QCSE) in polar III-V heterostructures by n-type doping in order to increase the oscillator strength of electronic transitions in quantum structures. In this study, we analyzed the cathodoluminescene (CL) spectra of different functional parts of individual AlN/GaN nanowire superlattices and studied their decay characteristics with sub-nanosecond time resolution. This allows us to extract information about strain and electric fields in such heterostructures with an overall spatial resolution <100 nm. The samples, which were investigated in a temperature range from 10 to 300 K by using time-integrated cathodoluminescence spectroscopy (TICL) and time-resolved cathodoluminescence spectroscopy (TRCL) consist of GaN bottom and top layer and a 40-fold stack of GaN nanodiscs, embedded in AlN barriers that were doped with Ge. We show, that the QCSE is reduced with increasing doping concentration due to a screening of the internal electric fields inside GaN nanodiscs, resulting in a reduction of the carrier lifetimes and a blue shift of the emitted light. Due to the small diameter of the electron excitation beam CL offers the possibility to individually analyze the different functional parts of the nanowires.