An analysis of possible experimental errors and artifacts for a time-domain dielectric spectrometer (frequency range 107–109 Hz) is performed using mathematical models. The spectrometer requires an incident and reflected pulse to be referenced in time and aligned in amplitude. Effects due to time misreferencing and amplitude misalignment are studied using a simple Teflon dielectric model. The calculated spectra for misreferencing and misalignment errors for a Teflon model are compared to real spectrometer data. Time misreferencing errors greater than 40 ps produce large errors at high frequencies and the absolute time reference can vary by one-half the sampling interval. Amplitude misalignment can create both false and forced convergence at the end of the pulses. Most importantly, misreference and misalignment errors may generate pseudodielectric effects. Other general models dealing with artifacts due to the solid nature of the sample were developed to include contact resistance, contact inductance, and fringe capacitance. The inclusion of contact resistance produced loss behavior that moved to higher frequencies with lower resistances. When contact inductance is included, the ε′ values increase in the frequency range examined. Inclusion of fringe capacitance produced a slight rise in the ε′ values, proportional to the sample thickness. The time-domain lumped capacitor dielectric spectrometer becomes a viable tool in studies of dielectric materials at high frequencies when attention is given to possible experimental errors and artifacts.