A method is presented, of sharpening metal points which are used in field emission and field-ion microscopy. By sputtering electropolished tungsten tips using neon ions, the tip radius can be controllably reduced from that which results from thermal cleaning (typically 1000 Å) to below 200 Å. These tips, which can exploit the full resolution of the field ion microscope, can be formed on thermally cleaned shanks. The rate of reduction in radius is presented as a function of neon pressure and sputtering current. Changes in the tip shape which result from sputtering, are examined by scanning electron microscopy, and are used as a basis for a simple model of tip sputtering, which leads to the expectation that the method of sharpening is applicable to a wide variety of metals.
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