An approach is presented that uses the following techniques: automatic test case generation, self-checking test cases, black box test cases, random test cases, sampling, a form of exhaustive testing, correctness measurements, and the correction of defects in the test cases instead of in the product (defect circumvention). The techniques are cost-effective and have been applied to very large products.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>