In the modern world of digital electronics, sequential digital structures are integral components of many electronic systems and devices. Such systems and devices find extensive applications across various domains of human endeavor, including communication systems, automatic, and automated devices. The tasks associated with monitoring and diagnosing these systems come with certain challenges. Research in this field holds particular significance for ensuring the resilience and reliability of digital systems in contemporary technological environments. In this context, the study of the characteristics of diagnosing sequential digital structures assumes a special importance. Diagnosing, in this context, refers to the systematic solving of problems related to determining the technical condition, localizing malfunctions (down to individual radio-electronic components), and forecasting the technical state over a specific period. Identifying individual Radio-Electronic Components (RECs) within a digital system means pinpointing a specific microchip whose functioning does not meet the technical specifications. This is crucial, as microchips, despite their complexity and multifunctionality, constitute minimal replaceable units. Monitoring the technical condition is especially crucial in systems containing a large number of interacting sequential digital elements. One of the key challenges in developing methods for monitoring sequential digital structures is their sheer numerical size and the presence of a multitude of logical elements, each of which can be a potential source of error when performing basic logical operations. Hence, engineers have to devise novel, efficient methods and algorithms for error detection in such systems.