The structural and magnetic properties of thin Co films grown onPt(111) were investigated in situ under UHV using simultaneous surfacex-ray diffraction, resonant magnetic surface x-ray diffraction at the PtLIII absorption edge and the surface magneto-optic Kerr effect. We focus on the difference betweenlow-temperature growth and growth at 300 K. Thin (1–5 nm) Co films grown at 120 K(low-T films) have the hcp structure and a small concentration of stacking faultscompared to films of the same thickness grown at 300 K (RT films), which containmany stacking faults and have a predominant fcc structure. In addition, thelow-T films are flatter. The RT films exhibit a clear reorientation transition of themagnetization, from perpendicular to parallel, at a thickness of 1 nm. In contrast, thelow-T films display intense polar Kerr signals up to the largest investigatedthickness (5 nm). In these films, the reorientation transition takes placeover a large thickness range, through a canted phase. Heating up alow-T film to 300 K induces a rotation of the average easy axis towards the film plane, still with ahigh polar Kerr signal at 300 K. This behaviour with temperature is mostly reversible.These results are discussed on the basis of the temperature dependence of the anisotropyconstants and magnetocrystalline anisotropy differences between the fcc and hcp phases.