As a first step in trying to understand the relationship between magnetic properties and structural properties, the authors have conducted a systematic structural investigation of CoCrPt samples that have been sputtered at different levels of sputtering power, which affects magnetic properties. X-ray diffraction (XRD), small angle x-ray scattering (SAXS), and XAFS were used to examine, respectively, long, medium, and short range orderings. TEM was used to examine the structural morphology. CoCrPt was fabricated on Kapton films by dc magnetron sputtering at levels of 0.1, 0.3, 0.5, and 1 kW sputtering power. XRD indicated a continuous increase in the intensity of the peak corresponding to hcp (002), as sputtering power was increased. SAXS, on the other hand, in the range of 0.5–3.0 deg. at 2θ, indicated the presence of scattering for the 0.1 and 0.3 kW samples alone, not for the others. Similarly discontinuous were the spectrums produced by XANES of Co for the 0.3, 0.5, and 1.0 kW samples, which resembled the spectrum of sputtered Co. The spectrum of the 0.1 kW samples was quite different. TEM indicated a clear small-grain structure for the 0.1 kW sample, less clearly defined grains for the 0.3 kW sample, and no observable grains for the others. When conducted after chemical etching, it further identified the source of the grain structure as Pt segregation. This leads to speculation that Pt segregation may be responsible, to some degree, for the discontinuity observed in SAXS and XANES measurements. It is further speculated that the long range ordering (crystal orientation) is quite probably related to magnetic anisotropy, and that segregation affects wall motion, which means that, in order to understand the relationship between magnetic and structural properties, structural investigations should be systematic and include short, medium, and long range orderings.