The electronic energy level evolution of fullerene (C 60) on molybdenum oxide (MoO x )/conducting indium tin oxide (ITO) interfaces has been investigated with ultra-violet photoemission spectroscopy (UPS), inverse photoemission spectroscopy (IPES) and atomic force microscopy (AFM). It was found that the thermally evaporated MoO x inter-layer substantially increased the surface workfunction. This increased surface workfunction strongly attract electrons towards the MoO x layer at the C 60/MoO x interface, resulting in strong inversion of C 60. Energy levels of C 60 relax gradually as the thickness of C 60 increases. An exceptionally long (>400 Å) band bending is observed during this relaxation in C 60. Such a long band bending has not been reported so far, for the organic/insulator (MoO x ) interface. The effect of air exposed MoO x inter-layer between ITO and C 60 has also been investigated. After air exposure of MoO x almost no band bending was observed and the electronic energy levels of C 60 remained more or less flat.
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