The authors present results of a study conducted to evaluate the effects of measurement noise on the estimation of machine parameters from standstill frequency response test data. Results obtained indicate that, because the test data are inherently noise-corrupted, multiple solution sets can be obtained. Moreover, some of the estimated machine parameters could be unrealistic. It is shown that the results are very sensitive to the value of armature resistance used in the data analysis. Even a 0.5% error in the value of armature resistance could result in unrealistic estimation of the machine parameters.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>