A 10 MeV, 5 kW S-band travelling wave electron linear accelerator has been developed at Raja Ramanna Centre for Advanced Technology for industrial applications. The electron accelerating structure is made of oxygen-free electronic (OFE) copper and comprises of fifty-six brazed joints and is fabricated in multiple stages, as per the process and testing requirements. The accelerating structure is often required to be repaired through an additional brazing cycle with the same filler. The present study evaluates possible microstructural and mechanical property degradation of OFE copper brazed joints, as a result of its exposure to multiple brazing cycles. The study was performed on an OFE copper cavity stack brazed assembly, made through a four-stage brazing using BVAg-8 as braze filler. The resultant brazed assembly did not exhibit any leak at a sensitivity of 1 × 10−10 mbar.L/s. The results of the study demonstrate that OFE copper brazements can be safely subjected to an additional brazing cycle without causing significant degradation in its microstructure and strength. However, brazed joint’s exposure to any additional brazing cycles results in the formation of voids and cracks due to intergranular penetration of silver, with associated drop in tensile strength from about 210 MPa to about 150-180 MPa. Based on the results of study, it is recommended to qualify the accelerating structure, fabricated through multiple brazing cycles, by a suitable non-destructive technique. The results of the study are important for design, fabrication and maintenance of electron linear accelerator components.
Read full abstract