This article proposes a scan driver circuit based on indium–gallium–zinc oxide (IGZO) thin-film transistors (TFTs) for multiple output signals. The proposed circuit could generate two overlapped output signals using a separate driving structure. The separate driving structure enabled the control nodes of each output signal to have a sufficiently high voltage during the output period. Consequently, the proposed circuit stably operated with the threshold voltage ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\textit{V}_{\text{TH}}\text{)}$</tex-math> </inline-formula> varying from <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$-$</tex-math> </inline-formula> 3 to 4 V in the circuit simulation. The proposed scan driver circuit could reduce the circuit area because a single stage could output two output signals for two adjacent scan lines. Furthermore, the fabricated scan driver circuit exhibited a stable operation with multiple overlapped signals. Consequently, the proposed IGZO TFT-based scan driver circuit showed a stable circuit operation with multiple output signals through the separate driving structure.
Read full abstract