ScanningVolume 3, Issue 3 p. 210-214 Original PaperFree to Read Thin films for SEM specimen coatings: The backscattered electron contribution M. R. Sogard, M. R. Sogard Enrico Fermi Institute and Physics Department, The University of Chicago, 5640 South Ellis Avenue, Chicago, Illinois 60637, USASearch for more papers by this author M. R. Sogard, M. R. Sogard Enrico Fermi Institute and Physics Department, The University of Chicago, 5640 South Ellis Avenue, Chicago, Illinois 60637, USASearch for more papers by this author First published: 1980 https://doi.org/10.1002/sca.4950030313Citations: 1AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Citing Literature Volume3, Issue31980Pages 210-214 RelatedInformation