The recipients of the 2003 IEEE NSREC Outstanding Paper Award are Dale McMorrow, William Lotshaw, Joseph Melinger, Steve Buchner, Younes Boulghassoul, Lloyd Massengill, and Ron Pease for their paper entitled "Three-Dimensional Mapping of Single Event Effects Using Two Photon Absorption." This work describes the application of a new technique, two-photon absorption, to examine single event effects in a semiconductor device. In two-photon absorption, a laser is used in which the wavelength is chosen to be lower than the bandgap of the semiconductor so that no carriers are generated at low intensities. However, at high intensities, the material can absorb two photons simultaneously to generate a single electron-hole pair. This allows tight control over where the carrier generation occurs, and provides for charge injection at any depth within the device structure permitting three-dimensional mapping of single event effects sensitivity of the device. In this work, the technique is developed and an example map is shown for single event transients in an LM124 operational amplifier.