Identification of secondary traits in mapping populations is usually hindered by the strong effect of anthesis time. Thus, considering the variability in time to anthesis in combination with an accurate phenotyping of mapping populations and available molecular tools is a possible way for recognising secondary traits to improve yield potential. The aim of this work was to identify secondary traits to perform indirect selection for grain yield (GY) in a bread wheat mapping population consisting of 124 doubled haploid lines, derived from the cross between two soft red winter wheat genotypes with contrasting photoperiod response. Genomic regions linked to different traits were analysed under two environments. The population showed a strong effect of time to anthesis over GY, as expected. A large variability in GY was observed but only two QTLs were detected on chromosome 5A for this trait, which co-localized with QTLs of time to anthesis. GY variation was partially associated with above-ground dry matter at maturity (AGDM) and to a lesser extent with harvest index (HI). Detected QTLs for grains per m2 (GN), grain weight, AGDM and HI explained between 25 and 61% of the GY additive genetic variance. GN, defined as the product between spike dry weight at anthesis (SDW) and fruiting efficiency (FE), was the main numerical component that explained most of the variation in GY. Five QTLs were detected for SDW, which did not co-localize with QTLs of time to anthesis and captured ca. 50% of the additive genetic variance, while there was a weak relationship between NG and FE. When genotypes were filtered by similar anthesis time and plant height, SDW was identified as a promising secondary trait to be targeted for indirect selection of GY.
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