We report on the realization of high quality single quantum wells (SQWs) in the highly strained AlxGa1−xAs/In0.26Ga0.74As/AlzGa1−zAs system with 0≤(x, z)≤1.0. Photoluminescence (PL) linewidths of 5.5±0.4 meV for 0.30≤(x and z)≤0.70 have been achieved. Use of both alloys and short period multiple layer structures as the well and/or barrier layers has been examined. The silicon nitride encapsulation as well as rapid thermal annealing (RTA) induced changes in the PL properties of the as-grown SQW structures have been examined. Deposition of the nitride is found to induce a blue shift in the exciton peak. RTA induces a further blue shift, though not as large as that induced by RTA of unencapsulated (i.e., as-grown) structures. The RTA induced changes indicate interdiffusion of the group III atoms at the GaAs/InGaAs and InGaAs/AlGaAs interfaces.