The complexity of microstructures characteristic of polycrystalline materials presents the serious investigator with many challenges. The materials engineer hopes to associate the important technological properties of these materials with specific (quantifiable) attributes of the microstructure; however, microscopy presents an overwhelming myriad of details over a wide range of scales of inquiry. Thus, the persistent question becomes: What is important in the microstructure relative to a specific property or aspect of material performance? One particular viewpoint, which stems from the modern atomistic interpretation of the structure of solids, is that for polycrystalline materials it is the spatial placement of lattice orientation that is of essential interest.The past decade has seen some remarkable progress in microdiffraction technique in conjunction with the scanning electron microscope. This progress now makes it possible to vigorously pursue the aforementioned lattice-orientational viewpoint. Since 1987 modern SIT (silicon intensified target) vidicon and CCD (charge-coupled device) cameras have been used to capture the backscattered Kikuchi diffraction (BKD) formed in stationary spot mode in the scanning electron microscope.
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