Silicon Carbide Photoconductive Semiconductor Switches Research Articles

Influence of Pinch Effect on the Lifetime of a 2MW Silicon Carbide Photoconductive Semiconductor Switch

Influence of Pinch Effect on the Lifetime of a 2MW Silicon Carbide Photoconductive Semiconductor Switch

Influence of optical grating on the triggering efficiency of VCSI silicon carbide photoconductive semiconductor switch

In this article, we present a new configuration of opposed-contact vanadium-compensation semi-insulating (VCSI) 4H–SiC photoconductive semiconductor switch (PCSS) to reduce the input laser energy for operation. The configuration is made up of three parts: the PCSS with optical grating, the convex lens in front of PCSS, and the additional reflector behind PCSS. Periodic surface structures were fabricated on the VCSI 4H–SiC substrate by ultrafine femtosecond laser direct writing to etch optical gratings. The microstructure on the lower surface plays the role of reflection grating, so that the laser forms a specific distribution pattern and enhances the laser absorption. Experiments and simulations show that the triggering efficiency increased 3.7 times compared to PCSS without grating at 532 nm laser. And output voltage can reach 90 % of the input bias voltage. This SiC PCSS optical system significantly reduces the laser energy without reducing the electrodes spacing.

Pulsed characterization of a UV LED for pulsed power applications on a silicon carbide photoconductive semiconductor switch.

The electrical and optical characteristics of a high-power UV light emitting diode (LED) (365 nm wavelength) were evaluated under pulsed operating conditions at current amplitudes several orders of magnitude beyond the LED's manufacturer specifications. Geared towards triggering of photoconductive semiconductor switches (PCSSs) for pulsed power applications, measurements were made over varying pulse widths (25 ns-100 μs), current (0 A-250 A), and repetition rates (single shot-5 MHz). The LED forward voltage was observed to increase linearly with increasing current (∼3.5 V-53 V) and decrease with increasing pulse widths. The peak optical power observed was >30 W, and a maximum system efficiency of 23% was achieved. The evaluated LED and auxiliary hardware were successfully used as the optical trigger source for a 4H-SiC PCSS. The lowest measured on-resistance of SiC was approximately 67 kΩ.

High Power Lateral Silicon Carbide Photoconductive Semiconductor Switches and Investigation of Degradation Mechanisms

Several generations of high power, lateral, linear mode, intrinsically triggered 4H-SiC photoconductive semiconductor switch designs and their performance are presented. These switches were fabricated from high purity semi-insulating 4H-SiC samples measuring 12.7 mm × 12.7 mm × 0.36 mm and were able to block dc electric fields up to 370 kV/cm with leakage currents less than 10 μA without failure. Switching voltages and current s up to 26 kV and 450 A were achieved with these devices and ON-state resistances of 2 Ω were achieved with 1 mJ of 355 nm laser energy (7 ns FWHM). After fewer than 100 high power switching cycles, these devices exhibited cracks near the metal/SiC interface. Experimental and simulation results investigating the root cause of this failure mechanism are also presented. These results strongly suggest that a transient spike in the magnitude of the electric field at the metal/SiC interface during both switch closing and opening is the dominant cause of the observed cracking.

Influence of different illumination profiles on the on-state resistances of silicon carbide photoconductive semiconductor switches.

Characteristics of a silicon-carbide (SiC) photoconductive switch under different illumination profiles are presented. We triggered a V-doped semi-insulated 6H-SiC switch with lateral geometry using a laser beam of 532-nm wavelength. Photoconductivity tests for different spot profiles and locations show that such switches achieve a minimum on-state resistance when the switching gap is illuminated. The differences between on-state resistances are small for various partial illuminations of the switching gap. Semiconductor modeling is used to simulate the electric field and current profiles for different partial illuminations. The simulation results show poor on-state switch performance when partially illuminated. Based on these results, a more revealing circuit model for the switch matches well with experimental results for partial illuminations.

A compact 45 kV curve tracer with picoampere current measurement capability

This paper discusses a compact high voltage curve tracer for high voltage semiconductor device characterization. The system sources up to 3 mA at up to 45 kV in dc conditions. It measures from 328 V to 60 kV with 15 V resolution and from 9.4 pA to 4 mA with 100 fA minimum resolution. Control software for the system is written in Microsoft Visual C# and features real-time measurement control and IV plotting, arc-protection and detection, an electrically isolated universal serial bus interface, and easy data exporting capabilities. The system has survived numerous catastrophic high voltage device-under-test arcing failures with no loss of measurement capability or system damage. Overall sweep times are typically under 2 min, and the curve tracer system was used to characterize the blocking performance of high voltage ceramic capacitors, high voltage silicon carbide photoconductive semiconductor switches, and high voltage coaxial cable.

Effects of substrate crystallinity on the on-state resistance of 6H–SiC photoconductive switches

Abstract