In eddy current (EC) defect evaluation, accurate determination of the crack depth is crucial. The lift-off signal on the complex impedance plane is not necessarily horizontal and mostly arc-shaped, which makes it difficult to separate from crack signals, which can have various orientations depending on probe characteristics and frequencies. Phase rotation is normally used to align the lift-off signal to the real axis and defect signal is read from the imaginary axis. However, this approach proves challenging to separate lift-off and defect signals within the complex plane in many cases.To address this issue, this study proposes and implements a Mobius transformation that linearizes the arc-shaped lift-off signals on the complex plane, enabling more accurate extraction of crack signals unaffected by lift-off signal height. Furthermore, it is demonstrated through k-nearest neighbors (kNN) that the transformed crack signals can still be effectively quantified.
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