Correlated photon calibration based on spontaneous parametric down-conversion (SPDC) provides a highly precise means to calibrate the detection efficiency of avalanche photodiode (APD). During the calibration process of detection efficiency via SPDC, precise measurement of the arrival time of correlated photons and accurate photon counting are essential. To achieve this goal, a data acquisition (DAQ) system with low-dead-time, high-resolution Time-to-Digital Converter (TDC) was designed in this paper. This TDC is designed based on tapped delay line (TDL), which is implemented on Xilinx Kintex-7 series field programmable gate array (FPGA). This TDC can accurately measure the time of arrival of input signals. Upon arrival of a photon signal, the TDC rapidly generates a timestamp to record the arrival time of the photon signal. Utilizing these timestamps, time delay and accurate measurements of time intervals can be achieved. The specially designed TDC input stage structure and encoding algorithm enable the alternating propagation and sampling of `01' and `10' transitions on TDL. Coupled with a pipelined architecture, the TDC's dead time is close to one clock cycle, which is 2.33 ns in the current implementation version. The structure of mode recognition and triggering ensures that the TDC can correctly calibrate time measurements and count photon counts. Experimental results show that the TDC achieves an RMS precision of better than 11.08 ps, and this measurement precision is maintained over long time intervals (0–10 us). The reliability of this DAQ for photon counting has been verified through standard signal sources.
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