Separate Absorption And Multiplication Avalanche Photodiodes Research Articles

Investigation of Ga2O3/diamond heterostructure solar-blind avalanche photodiode via TCAD simulation

A Ga2O3/diamond separate absorption and multiplication avalanche photodiode (SAM-APD) with mesa structure has been proposed and simulated. The simulation is based on an optimized Ga2O3/diamond heterostructure TCAD physical model, which is revised by repeated comparison with the experimental data from the literature. Since both Ga2O3 and diamond are ultra-wide bandgap semiconductor materials, the Ga2O3/diamond SAM-APD shows good solar-blind detection ability, and the corresponding cutoff wavelength is about 263 nm. The doping distribution and the electric field distribution of the SAM-APD are discussed, and the simulation results show that the gain of the designed device can reach 5 × 104 and the peak responsivity can reach a value as high as 78 A/W.

Extremely low excess noise avalanche photodiode with GaAsSb absorption region and AlGaAsSb avalanche region

An extremely low noise Separate Absorption and Multiplication Avalanche Photodiode (SAM-APD), consisting of a GaAs0.52Sb0.48 absorption region and an Al0.85Ga0.15As0.56Sb0.44 avalanche region, is reported. The device incorporated an appropriate doping profile to suppress tunneling current from the absorption region, achieving a large avalanche gain, ∼130 at room temperature. It exhibits extremely low excess noise factors of 1.52 and 2.48 at the gain of 10 and 20, respectively. At the gain of 20, our measured excess noise factor of 2.48 is more than three times lower than that in the commercial InGaAs/InP SAM-APD. These results are corroborated by a Simple Monte Carlo simulation. Our results demonstrate the potential of low excess noise performance from GaAs0.52Sb0.48/Al0.85Ga0.15As0.56Sb0.44 avalanche photodiodes.

Temperature Dependence of the Impact Ionization Coefficients in AlAsSb Lattice Matched to InP

The temperature dependence of the ionization coefficients of AlAsSb has been determined from 210 K to 335 K by measuring the avalanche multiplication in a series of three <i>p^&#x002B;-i-n^&#x002B;</i> and two <i>n^&#x002B;-i-p^&#x002B;</i> diodes. Both electron and hole ionization coefficients reduce at approximately the same rate as the temperature increases but much less so than in InAlAs or InP. This results in a significantly smaller breakdown voltage variation with temperature of 13 mV&#x002F;K in a 1.55 &#x03BC;m thick <i>p^&#x002B;-i-n^&#x002B;</i> structure and a calculated 15.58 mV&#x002F;K for a 10 Gb&#x002F;s InGaAs&#x002F;AlAsSb separate absorption and multiplication avalanche photodiode (SAM-APD). Monte-Carlo modelling suggests that the primary reason for this reduced temperature dependence is the increased alloy scattering in the Sb containing alloy, reducing the impact of variation in phonon scattering rate with temperature.

Mid-wavelength infrared avalanche photodetector with AlAsSb/GaSb superlattice

In this work, a mid-wavelength infrared separate absorption and multiplication avalanche photodiode (SAM-APD) with 100% cut-off wavelength of ~ 5.0 µm at 200 K grown by molecular beam epitaxy was demonstrated. The InAsSb-based SAM-APD device was designed to have electron dominated avalanche mechanism via the band structure engineered multi-quantum well structure based on AlAsSb/GaSb H-structure superlattice and InAsSb material in the multiplication region. The device exhibits a maximum multiplication gain of 29 at 200 K under -14.7 bias voltage. The maximum multiplication gain value for the MWIR SAM-APD increases from 29 at 200 K to 121 at 150 K. The electron and hole impact ionization coefficients were derived and the large difference between their value was observed. The carrier ionization ratio for the MWIR SAM-APD device was calculated to be ~ 0.097 at 200 K.

A model for the jitter of avalanche photodiodes with separate absorption and multiplication regions

An improved version of the Random Path Length algorithm is used to simulate the time response of Separate Absorption and Multiplication Avalanche PhotoDiodes (SAM-APDs) in the linear regime. The model takes into account both the diffusion and the drift of carriers in the absorption region as well as impact ionization scattering events in the multiplication region. An extended formulation of Ramo’s theorem is used to determine the current waveforms. The new algorithm has been used to extract the jitter of the time response of avalanche photodiodes to photons, which is a relevant figure of merit for time of flight applications of SAM-APDs. It is found that an electric field in the absorption region small enough to avoid unwanted carrier multiplication or band-to-band tunneling, is beneficial to reduce the jitter. Furthermore, we have found that, in APDs working in the linear regime, the stochastic duration of the current pulse makes difficult the use of circuit techniques, such as crossover timing, with constant delay lines aimed at detecting the individual pulses. The problem is partly mitigated when SAM-APDs are used for the detection of high energy photons, such as X-rays.

GaAs/Al0.8Ga0.2As separate absorption and multiplication region x-ray spectroscopic avalanche photodiodes

A GaAs/Al0.8Ga0.2As separate absorption and multiplication (SAM) x-ray avalanche photodiode (APD) structure was grown by metalorganic vapor phase epitaxy. Mesa photodiodes of different diameters (200 μm and 400 μm) were fabricated from the structure. Two of the photodiodes (one of each diameter) were characterized at 20 °C for their electrical properties and response to x rays using an 55Fe radioisotope x-ray (Mn Kα = 5.9 keV; Mn Kβ = 6.49 keV) source. An energy resolution of 508 eV ± 5 eV full width at half maximum (FWHM) at 5.9 keV was achieved at an apparent avalanche gain, M, of 1.1. This is the best energy resolution so far reported for GaAs/AlxGa1−xAs x-ray SAM APDs. The noise components associated with the achievable spectroscopic energy resolutions are reported. Comparisons between the 200 μm and 400 μm diameter GaAs/AlxGa1−xAs SAM x-ray APDs and recently studied GaAs p+-i-n+ detectors were made, showing that the inclusion of the avalanche layer improves the achievable energy resolution; energy resolutions of 508 eV FWHM at 5.9 keV at M = 1.1 and 603 eV FWHM at 5.9 keV at M = 1.2 were achieved with the 200 μm and 400 μm diameter GaAs/AlxGa1−xAs SAM x-ray APDs, respectively; this is better than was previously reported for similar devices without avalanche layers: 690 eV FWHM at 5.9 keV and 730 eV FWHM at 5.9 keV for 200 μm and 400 μm diameter GaAs p+-i-n+ detectors, respectively [Lioliou et al., J. Appl. Phys. 122, 244506 (2017)].

Back-illuminated AlGaN heterostructure solar-blind avalanche photodiodes with one-dimensional photonic crystal filter.

AlGaN heterostructure solar-blind avalanche photodiodes (APDs) were fabricated on a double-polished AlN/sapphire template based on a separate absorption and multiplication (SAM) back-illuminated configuration. By employing AlGaN heterostructures with different Al compositions across the entire device, the SAM APD achieved an avalanche gain of over 1×105 at an operated reverse bias of 92 V and a low dark current of 0.5 nA at the onset point of breakdown. These excellent performances were attributed to the acceleration of holes by the polarization electric field with the same direction as the reverse bias and higher impact ionization coefficient of the low-Al-content Al0.2Ga0.8N in the multiplication region. However, the Al0.2Ga0.8N layer produced a photocurrent response in the out of the solar-blind band. To retain the solar-blind detecting characteristic, a periodic Si3N4/SiO2 photonic crystal was deposited on the back of the AlN/sapphire template as an optical filter. This significantly improved the solar-blind characteristic of the device.

Energy‐Sensitive GaSb/AlAsSb Separate Absorption and Multiplication Avalanche Photodiodes for X‐Ray and Gamma‐Ray Detection

AbstractDemonstrated are antimony‐based (Sb‐based) separate absorption and multiplication avalanche photodiodes (SAM‐APDs) for X‐ray and gamma‐ray detection, which are composed of GaSb absorbers and large bandgap AlAsSb multiplication regions in order to enhance the probability of stopping high‐energy photons while drastically suppressing the minority carrier diffusion. Well‐defined X‐ray and gamma‐ray photopeaks are observed under exposure to 241Am radioactive sources, demonstrating the desirable energy‐sensitive detector performance. Spectroscopic characterizations show a significant improvement of measured energy resolution due to reduced high‐peak electric field in the absorbers and suppressed nonradiative recombination on surfaces. Additionally, the GaSb/AlAsSb SAM‐APDs clearly exhibit energy response linearity up to 59.5 keV with a minimum full‐width half‐maximum of 1.283 keV. A further analysis of the spectroscopic measurement suggests that the device performance is intrinsically limited by the noise from the readout electronics rather than that from the photodiodes. This study provides a first understanding of Sb‐based energy‐sensitive SAM‐APDs and paves the way to achieving efficient detection of high‐energy photons for X‐ray and gamma‐ray spectroscopy.

Enhanced front-illuminated p-i-p-i-n GaN/AlGaN ultraviolet avalanche photodiodes

We proposed an improved front-illuminated GaN/AlGaN separate absorption and multiplication (SAM) ultraviolet avalanche photodiode (APD) based on physical analysis and device simulations. By inserting an Al0.2Ga0.8N p-type layer into the p-i-p-i-n APD structure, a built-in electric field resulted from polarization effect will be introduced to facilitate the transport of electrons from absorption layer to multiplication region. The enhanced heterostructure APD presents significantly higher multiplication gain compared with the homogeneous one. Moreover, the doping concentration and thickness of the interlayer were optimized according to device performances, because the interlay has important effects on the electric field distribution and energy-band profile of the front-illuminated SAM APD.

InGaAs-GaAs Nanowire Avalanche Photodiodes Toward Single-Photon Detection in Free-Running Mode.

Single-photon detection at near-infrared (NIR) wavelengths is critical for light detection and ranging (LiDAR) systems used in imaging technologies such as autonomous vehicle trackers and atmospheric remote sensing. Portable, high-performance LiDAR relies on silicon-based single-photon avalanche diodes (SPADs) because of their extremely low dark count rate (DCR) and afterpulsing probability, but their operation wavelengths are typically limited up to 905 nm. Although InGaAs-InP SPADs offer an alternative platform to extend the operation wavelengths to eye-safe ranges, their high DCR and afterpulsing severely limit their commercial applications. Here we propose a new separate absorption and multiplication avalanche photodiode (SAM-APD) platform composed of vertical InGaAs-GaAs nanowire arrays for single-photon detection. Among a total of 4400 nanowires constituting one photodiode, each avalanche event is confined in a single nanowire, which means that the avalanche volume and the number of filled traps can be drastically reduced in our approach. This leads to an extremely small afterpulsing probability compared with conventional InGaAs-based SPADs and enables operation in free-running mode. We show a DCR below 10 Hz, due to reduced fill factor, with photon count rates of 7.8 MHz and timing jitter less than 113 ps, which suggest that nanowire-based NIR focal plane arrays for single-photon detection can be designed without active quenching circuitry that severely restricts pixel density and portability in NIR commercial SPADs. Therefore, the proposed work based on vertical nanowires provides a new degree of freedom in designing avalanche photodetectors and could be a stepping stone for high-performance InGaAs SPADs.

P-type interface charge control layers for enabling GaN/SiC separate absorption and multiplication avalanche photodiodes

A p-type interface charge control layer (PICCL) is introduced that enables optimization of the net positive polarization induced interface charge at the GaN/SiC interface in GaN/SiC separate absorption and multiplication avalanche photodiodes (SAM-APDs) by varying its thickness. The response from SAM-APDs with PICCL thickness less than 10 nm has an anomalous shape at all bias attributed to the collection of carriers generated directly in the SiC layer. Devices with a 15 nm thick PICCL exhibit GaN related response at high bias that is indicative of punch-through of the electric field into the GaN absorption region due to optimization of the net interface charge.

Temperature Dependence of Hole Impact Ionization Coefficient in 4H-SiC Photodiodes

Hole initiated multiplication characteristics of 4H-SiC Separate Absorption and Multiplication Avalanche Photodiodes (SAM-APDs) with a n- multiplication layer of 2.7 µm were obtained using 325nm excitation at temperatures ranging from 300 to 450K. The breakdown voltages increased by 200mV/K over the investigated temperature range, which indicates a positive temperature coefficient. Local ionization coefficients, including the extracted temperature dependencies, were derived in the form of the Chynoweth expression and were used to predict the hole multiplication characteristics at different temperatures. Good agreement was obtained between the measured and the modeled multiplication using these ionization coefficients. The impact ionization coefficients decreased with increasing temperature, corresponding to an increase in breakdown voltage. This result agrees well with the multiplication characteristics and can be attributed to phonon scattering enhanced carrier cooling which has suppressed the ionization process at high temperatures. Hence, a much higher electric field is required to achieve the same ionization rates.

Avalanche Multiplication and Impact Ionisation in Separate Absorption and Multiplication 4H-SiC Avalanche Photodiodes

The hole dominated avalanche multiplication characteristics of 4H-SiC Separate Absorption and Multiplication avalanche photodiodes (SAM-APDs) were determined experimentally and modeled using a local multiplication model. The 0.5x 0.5mm2 diodes had very low dark current and exhibited sharp, uniform breakdown at about 580V. The data agree with modeling result using extrapolated impact ionization coefficients reported by Ng et al. and is probably valid for electric fields as low as ~0.9MV/cm at room temperature provided that both the C-V measurements and electric field determination in this work are correct. The packaged devices demonstrate a positive temperature coefficient of breakdown voltage for temperatures ranging from 100K to 300K which is a desired feature for extreme environment applications.

Uncooled low-voltage AlGaAsSb/InGaAsSb/GaSb avalanche photodetectors

Low-voltage AlGaAsSb/InGaAsSb/GaSb separate absorption and multiplication avalanche photodiodes (SAM-APD), as well as InGaAsSb/GaSb APDs with an AlGaAsSb passivating layer, are fabricated using liquid phase epitaxy. Formation of the p–n junction is performed either epitaxially or through diffusion of Zn from the vapour phase. Responsivity as high as 43 A/W at wavelength of 2100 nm is achieved at room temperature in AlGaAsSb/InGaAsSb/GaSb SAM-APDs reverse biased at 6.7 V. Relatively high responsivity (8.9 A/W at 2000 nm) was also measured in an InGaAsSb/GaSb APD reverse biased at 7.5 V.

MBE growth of HgCdTe avalanche photodiode structures for low-noise 1.55 μm photodetection

Molecular-beam epitaxy (MBE) has been utilized to fabricate HgCdTe heterostructure separate absorption and multiplication avalanche photodiodes (SAM-APD) sensitive to infrared radiation in the 1.1–1.6 μm spectral range, as an alternative technology to existing III–V APD detectors. Device structures were grown on CdZnTe(211)B substrates using CdTe, Te, and Hg sources with in situ In and As doping. The composition of the HgCdTe alloy layers was adjusted to achieve both efficient absorption of IR radiation in the 1.1–1.6 μm spectral range and low excess-noise avalanche multiplication. The Hg 1− x Cd x Te alloy composition in the gain region of the device, x=0.73, was selected to achieve equality between the bandgap energy and spin–orbit splitting to resonantly enhance the impact ionization of holes in the split-off valence band. The appropriate value of this alloy composition was determined from analysis of the 300 K bandgap and spin–orbit splitting energies of a set of calibration layers, using a combination of IR transmission and spectroscopic ellipsometry measurements. MBE-grown APD epitaxial wafers were processed into passivated mesa-type discrete device structures and diode mini-arrays using conventional HgCdTe process technology. Device spectral response, dark current density, and avalanche gain measurements were performed on the processed wafers. Avalanche gains in the range of 30–40 at reverse bias of 85–90 V and array-median dark current density below 2×10 −4 A/cm 2 at 40 V reverse bias have been demonstrated.

Performance of thin separate absorption, charge, and multiplication avalanche photodiodes

Previously, it has been demonstrated that resonant-cavity-enhanced separate-absorption-and-multiplication (SAM) avalanche photodiodes (APDs) can achieve high bandwidths and high gain-bandwidth products while maintaining good quantum efficiency. In this paper, we describe a GaAs-based resonant-cavity-enhanced SAM APD that utilizes a thin charge layer for improved control of the electric field profile. These devices have shown RC-limited bandwidths above 30 GHz at low gains and gain-bandwidth products as high as 290 GHz. In order to gain insight into the performance of these APDs, homojunction APDs with thin multiplication regions were studied. It was found that the gain and noise have a dependence on the width of the multiplication region that is not predicted by conventional models. Calculations using width-dependent ionization coefficients provide good fits to the measured results. These calculations indicate that the gain-bandwidth product depends strongly on the charge layer doping and on the multiplication layer thickness and, further, that even higher gain-bandwidth products can be achieved with optimized structures.

High-speed resonant-cavity separate absorption and multiplication avalanche photodiodes with 130 GHz gain-bandwidth product

Previously it has been shown that resonant-cavity, separate absorption and multiplication (SAM) avalanche photodiodes (APDs) exhibit high peak external quantum efficiency (∼75%), low dark current, low bias voltage (&amp;lt;15 V), and low multiplication noise (0.2&amp;lt;k&amp;lt;0.3). We describe the frequency response of resonant-cavity AlGaAs/GaAs/InGaAs SAM APDs. A unity-gain bandwidth of 23 GHz and a high gain-bandwidth product of 130 GHz have been achieved.

A transimpedance APD optical receiver operating at 10 Gb/s

The authors report an optical receiver which uses a separate-absorption-and-multiplication avalanche photodiode (SAM-APD) to achieve high sensitivity at a bit rate of 10 Gb/s. A transimpedance front end incorporating HEMT devices is used for high bandwidth and low noise. The sensitivity (bit-error rate of 10/sup -9/) is -28.7 dBm for a return-to-zero signal, and -27.0 dBm for a nonreturn-to-zero signal. >