ABSTRACTHydrogenated amorphous silicon (a-Si:H) TCO/n+/i/Ni Schottky barrier solar cells were degraded with illuminations of white and red light through both sides of the structure. Because the forward dark I-V's are sensitive to the distribution and any spatial variation of defects in the i-layer, these measurements were used to characterize the degraded cell structures. These characteristics were analyzed using a charged defect distribution of gap states consisting of D+, D°, and D states derived from corresponding film analysis. It was found that the non-uniformities of light induced defects created in the i-layer can be represented by two regions of different defect densities. The relative densities depend on the direction of illumination and their ratio even with white light is about a factor of four. This non-uniformity is expected to be less for p-i-n cells which have higher built-in potential and hence electric fields.
Read full abstract