We present a low-temperature magnetic force microscope (MFM) incorporating a piezoresistive cantilever and a dual-range scanner for experiments across a wide temperature range from cryogenic levels to room temperature. The piezoresistor-based MFM eliminates the need for optical readjustment, typically required due to thermal expansion at varying temperatures, thereby providing a more stable and precise measurement environment. The integration of a dual scanner system expands the versatility of scanning operations, enabling accurate sample positioning for detailed exploration of magnetic and superconducting properties under diverse thermal conditions. To demonstrate the capabilities of our MFM, we show detailed imaging of Fe3GaTe2, a van der Waals ferromagnet, and Yb0.7Y0.3CuAs2, a ferromagnetic cluster glass material. These studies demonstrate the potential of our MFM in revealing intricate details of magnetic domain dynamics and contribute to our understanding of materials exhibiting the anomalous Hall effect as well as superconducting phenomena.