A number of chalcogenides show a remarkable portfolio of properties, which enables a plethora of applications including thermoelectric power generation and phase change material (PCM)‐based information storage. PCMs exhibit fast and reversible switching between two (typically, amorphous and crystalline) states, characterized by different optical and electrical properties. In the last decade, textured chalcogenide thin films have been investigated to develop a better understanding of structure – property relationships, improve material performance and understand how these properties change upon reducing film thickness. In this review, the present knowledge concerning the textured growth is summarized, focusing on films of GeTe, Sb2Te3, and GeSbTe compounds. In particular, the impact of different deposition methods, substrate surface modifications, and methods to influence film formation is reviewed. In the second part of this review, confinement effects are discussed. Surprisingly pronounced changes in atomic arrangement, that affect film properties, and device performance are presented. These changes are attributed to the unconventional bonding mechanism in these chalcogenides coined metavalent bonding, which is trongly affected by the confinement. Bonding becomes covalent‐like in the two‐dimensional limit, whereas Metavalent Bonding emerges for thicker films, where electron delocalization is increased This explains the pronounced property changes with film thickness.
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