When signals in the duration range from some tens of nanoseconds to some tens of microseconds are measured in detail with a sampling oscilloscope coupled to a fast time averaging system, severe shape distortions are usually observed one to two decades below the maximum amplitude. It is shown that these distortions are mainly due to capacitive feedthrough over the nonoperating sampling gate. The analysis of this phenomenon shows that the observed response is the sum of the input signal and of its weighted convolution by a slow response of microsecond duration. Feedthrough was decreased by up to two orders of magnitude by a minor change in the input circuit of the sampling gate, without affecting the intrinsic high speed of the oscilloscope response. The methods to optimize this compensation are described. Applications to the correct measurement of exponentially decreasing signals over more than three decades are shown.
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