The article introduces the possible issue of internal CMOS Successive Approximation Register microcontroller’s Analog-to-Digital Converters (ADC) input currents. It describes the nature of the ADC input current and its dependence on the sampling frequency but also explains the issue when the ADC input appears to the user as a voltage source. Methods for measurement of parameters such as input charge, residual voltage, and equivalent capacitance of sample-hold circuits are presented and used in the proposed simplified model of ADC input behavior. These parameters, which are not listed in the datasheets, if not respected in the data acquisition design, can adversely affect how the ADC is used when measuring signal sources with non-negligible internal resistance. The article also explains how to solve a voltage measurement on a source with high internal resistance even in a situation where, according to datasheets, it should already have limitations. If the microcontroller contains a dynamically switched multiplexer, it can lead to other consequences, such as changing the input current or residual voltage. The proposed simplified CMOS SAR ADC input behavior model in an MCU can help users in an MCU-based data acquisition system design.
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