Voltage sensing in Kv channels originates from the coupling of movement between the charged S4 segment and the activation gate at the cytoplasmic region of the pore domain. The voltage sensor moves prior to the pore opening and the pore must shut before the voltage sensor returns to its resting state. However, gating current recordings from Kv channels indicate that frequently voltage sensors return more slowly after depolarisations that populate open states, indicating that the open pore exerts a resistance to S4 return. This process of pore closure therefore intrinsically regulates the deactivation kinetics of Kv channels. We observed slow voltage sensor return (IgOFF) in WT-Kv1.2 channels under non-permeant ionic conditions after depolarisations to voltages that caused channel openings. Using TEA+ and NMG+ internal solutions resulted in a slower IgOFF than internal Cs+, suggesting that the intracellular ionic composition was modulating IgOFF. A mutation in the pore lining S6 segment to enlarge the inner cavity (Kv1.2-I402C) removed the slowing of IgOFF in the presence of internal NMG+, suggesting that NMG+ interacted within the inner cavity of the WT channel to prevent pore closure through a ‘foot in the door’ mechanism. Gating currents of a non-conducting, P-type inactivated channel (Kv1.2-W366F, V381T), in the presence of intracellular K+ ions also displayed a slowing of IgOFF after depolarisations that would open the channel pore. These results suggest that internal K+ ions bound in the inner cavity can also slow activation gate closure. We propose that internal ions in the cavity of Kv1.2 allosterically regulate the voltage sensor deactivation kinetics by preventing pore closure and thus rate limiting the return of voltage sensors.
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