Hydrogenated amorphous silicon films 0.45 and 1.12 μm thick, grown by RF glow discharge plasma PECVD on Corning-7059 glass, were irradiated by a 60Co source (activity 2.8 × 10 15 Bq) in the dose range 10–450 kGy at different dose rates. The dark current of the samples, under 100 V applied voltage, was measured before, during and after gamma irradiation. When the irradiation starts, the dark current increases up to a level linearly dependent on the dose rate. When the irradiation is switched off, the dark current returns close to the initial value in a few days. Such behaviour suggests a possible application of hydrogenated amorphous silicon films in dosimetry and as gamma ray sensors. Moreover, the film optical constants were computed from the transmittance spectra measured in the range 500–2500 nm, before and after irradiation. After irradiation, the film optical absorption is slightly increased and the energy gap is substantially unchanged.
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