The 2018 workshop on buried interface science with X-rays and neutrons was held at National Institute for Materials Science (NIMS), Tsukuba, Japan, on January 21–23, 2018. This was the latest in a series of 22 workshops held since 2001. In spite of unexpected heavy snowing, 56 scientists from all over Japan (as well as invited speakers from Malaysia and Taiwan) participated in the 2.5 days discussion. There are increasing demands for sophisticated metrology in order to observe nano-layers and interfaces in multilayered films, which are finding applications in electronic, magnetic, optical, and other devices. The transmission electron microscopy can help scientists if the cross-sectional samples are prepared and provided, but X-ray and neutron techniques is known for its ability to achieve similar atomic-scale analysis for layers and interfaces in a nondestructive manner. It ensures the subsequent analyses by other techniques. In addition to such inherent advantages, the latest progress in novel sophisticated X-ray and neutron sources could push the techniques towards further attractive applications. New detector technologies are also extremely important for new research exploring buried interfaces. The present workshop gathered together those with different research backgrounds, that is, from semiconductor electronics to chemical biomaterials, and even specialists of the accelerator, nuclear reactor, and detectors were invited to give insights into unsolved problems on buried interfaces. Recently, new edition of “Introduction to X-ray reflectivity” has appeared in the bookstores in Japan. The book is 30% thicker than the 1st edition, which was published in January 2009. The chapters explaining fundamental contents have been strengthened by the 10% pages increase. The book includes new chapters, such as “How we need to be careful in the data analysis?” “Micro analysis and imaging of inhomogeneous thin films,” and “Operando analysis and time resolved measurements.” In the application chapters, “Liquid-solid interfaces including electro-chemical interfaces” is newly added. The contents in “Polymer films” become almost twice. As useful related techniques, “Resonant soft X-ray scattering” and “X-ray photon correlation spectroscopy” are new additions. The final chapter is “Use of neutrons.” Several good books on X-ray techniques for surfaces and interfaces are already available, but this book will be a unique addition to such collections. For additional news about X-ray analysis and other spectroscopy sciences, please browse the Wiley website: http://www.SpectroscopyNow.com.