A comprehensive description of chemical mass shifts in the RF quadrupole ion trap (Paul trap) is given and their origin is explained. Extending a previously proposed model, it is shown that chemical mass shifts are a result of an ejection delay caused by field imperfections in RF ion traps with non-optimized geometry, in particular, field imperfections resulting from holes in the end-cap electrodes, and of compound-dependent modifications of this ejection delay by collisions of the ions with the buffer gas. Elastic collisions change peak shapes and peak widths, but give rise to only very small chemical mass shifts. Inelastic collisions, which result in dissociation, can lead to large chemical mass shifts. The field imperfections present in real ion traps are examined, and differences in the ion ejection behavior and in the chemical mass shifts occurring in boundary ejection and resonance ejection scans are investigated. The dependence of the shifts on the trap geometry, on the buffer gas pressure, on the RF amplitude scan rate, on ion mass, and on ion chemical structure, are explained. The proposed model for chemical mass shifts is validated through experimental measurements and quantitative simulations using the ion trap simulation program ITSIM. It is shown that peak shapes in mass spectra can be reproduced or predicted by simulations, for ion traps with a variety of geometries and operating conditions. Very good agreement between simulations and experiments is found, provided experimental and simulated geometries differ slightly in the end-cap separation, indicating that additional previously neglected field imperfections may be present in common RF ion traps.
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