Resistive Switching Memory Devices Research Articles

2D and Quasi-2D Halide Perovskite-Based Resistive Switching Memory Systems

Resistive switching (RS) memory devices are gaining recognition as data storage devices due to the significant interest in their switching material, Halide perovskite (HP). The electrical characteristics include hysteresis in its current–voltage (I–V) relationship. It can be attributed to the production and migration of defects. This property allows HPs to be used as RS materials in memory devices. However, 3D HPs are vulnerable to moisture and the surrounding environment, making their devices more susceptible to deterioration. The potential of two-dimensional (2D)/quasi-2D HPs for optoelectronic applications has been recognized, making them a viable alternative to address current restrictions. Two-dimensional/quasi-2D HPs are created by including extended organic cations into the ABX3 frameworks. By adjusting the number of HP layers, it is possible to control the optoelectronic properties to achieve specific features for certain applications. This article presents an overview of 2D/quasi-2D HPs, including their structures, binding energies, and charge transport, compared to 3D HPs. Next, we discuss the operational principles, RS modes (bipolar and unipolar switching), in RS memory devices. Finally, there have been notable and recent breakthroughs in developing RS memory systems using 2D/quasi-2D HPs.

Resistive random-access memories using quasi-2D halide perovskites for wafer-scale reliable switching behaviors

In this study, we propose the (PEA)2MA3Pb4I13, a quasi-two-dimensional (2D) halide perovskite, in the realm of resistive switching memory devices. A quasi-2D perovskite film (PEA)2MA3Pb4I13, with a thickness measuring 450 nm, has been effectively fabricated on a silicon substrate coated with platinum through an all-solution process conducted at low temperatures. The constructed resistive switching memory devices, incorporating an Ag/(PEA)2MA3Pb4I13/Pt/Ti/SiO2/Si configuration, display dependable and consistent bipolar switching attributes. The device shows an ultra-low operating voltage of less than +0.1 V, an impressive high ON/OFF ratio exceeding 108, reversible resistive switching via pulse voltage operation, and the capability for multilevel data storage. In addition, there is little variation in device characteristics depending on the location on a wafer or device size.

Understanding the Reversible Transition of Unipolar and Bipolar Resistive Switching Characteristics in Solution-Derived Nanocrystalline Au-Co3O4 Thin-Film Memristors.

Nanocrystalline Au-Co3O4 thin films were fabricated through a facile solution-processing method, and voltage-polarity-dependent resistive switching (RS) characteristics including variability of Set/Reset voltages, stability of cycling endurance, and carriers transport mechanism were studied in the Pt/Au-Co3O4/Pt memory devices. The switching voltages of the Set and Reset processes in the bipolar RS memristors exhibited lower variability as compared to the unipolar resistance switching devices. Moreover, the switching performance of cycle-to-cycle endurance in bipolar mode had a smaller fluctuation than those of unipolar switching behavior. Based on the current-voltage curve fitting analysis, it was found that Ohmic-conduction behaviors dominated the carriers transport of low-resistance state regardless of unipolar or bipolar switching behaviors. The carrier transport of high resistance state was governed following Poole-Frenkel emission and Schottky emission mechanisms in the unipolar and bipolar switching modes, respectively. The physical switching mechanism of Pt/Au-Co3O4/Pt memory devices was proposed using the model by means of growth and disruption of conducting filaments, involved in memory effects of thermochemical mechanism and valence change mechanism in the unipolar and bipolar RS, respectively. The proposed model following the finite element method revealed the roles of electrical field distribution and temperature gradient to further clarify the RS mechanism. Our results open a door for understanding and optimizing oxide-based thin-film resistance switching memory devices.

Sustainable Mixed-Halide Perovskite Resistive Switching Memories Using Self-Assembled Monolayers as the Bottom Contact.

The complex ionic-electronic conduction in mixed halide perovskites enables their use beyond von Neumann architectures implemented in resistive switching memory devices. Although device fabrication based on perovskite compounds involves solution-processing at low temperatures, reducing further fabrication costs by eliminating expensive materials can improve their compatibility with upscalable deposition techniques. Notably, the substrate on which the perovskite active layer is developed has been reported to severely affect its quality and thus the overall device performance. Hereby, we demonstrate the sustainable manufacturing of memristive perovskite solar cells by replacing the expensive poly[bis(4-phenyl)(2,4,6-trimethylphenyl)amine] (PTAA) that serves as a hole transporting layer (HTL) with a self-assembled monolayer (SAM), namely [2-(3,6-dimethoxy-9H-carbazol-9-yl)ethyl]phosphonic acid (MeO-2PACz). Multiple sequential memristive current-voltage characteristics of single devices are reported, and average data of multiple reference and targeted devices are compared. Resistive switching memory devices based on SAM exhibit improved performance having reduced average SET voltage values and narrower statistical variation compared to reference devices with PTAA. It is shown that both PTAA and SAM based devices exhibit high ON/OFF ratio of about 103 operating at low switching electric fields. Replacing an expensive polymer-based HTL with this approach reduces fabrication costs compared to PTAA.

Investigation of Grain Boundary Effects in Sm0.2Ce0.8O2-x Thin Film Memristors.

Cerium-based materials (CeO2-x) are of significant interest in the development of vacancy-modulated resistive switching (RS) memory devices. However, the influence of grain boundaries on the performance of memristors is very limited. To fill this gap, this study explores the influence of grain boundaries in cerium-based thin film resistive random-access memory (RRAM) devices. Sm0.2Ce0.8O2-x (SDC20) thin films were deposited on (100)-oriented Nb-doped SrTiO3 (NSTO) and (110)-oriented NSTO substrates using pulsed laser deposition (PLD). Devices constructed with a Pt/SDC20/NSTO structure exhibited reversible and stable bipolar resistive switching (RS) behavior. The differences in conduction mechanisms between single-crystal and polycrystalline devices were confirmed, with single-crystal devices displaying a larger resistance window and higher stability. Combining the results of XPS and I-V curve fitting, it was confirmed that defects near the grain boundaries in the SDC-based memristors capture electrons, thereby affecting the overall performance of the RRAM devices.

Unraveling Conductive Filament Formation in High Performance Halide Perovskite Memristor

AbstractHalide perovskites (HPs) are promising materials for memristor devices because of their unique characteristics. In this study, nonvolatile resistive switching memory devices based on thick MAPbI3 perovskite (800 nm) films with structure FTO/MAPbI3/polymethyl methacrylate (PMMA)/Ag are presented. Reproducible and reliable bipolar switching characteristics are demonstrated with an ultra‐low operating voltage (−0.1 V), high ON/OFF ratio (106), endurance (>2 × 103 times) and a record retention time (>105 s). The I–V curve of the first cycle exhibits self‐formed conductive filaments. These are attributed to the presence of metallic Pb resulting from an excess of PbI2 in the perovskite film. The subsequent activation process involves the formation of conductive filaments, consisting of either iodide vacancies or migrated charged metals. Numerical simulations are then carried out to understand the nature of these conductive filaments and the role of the internal electric field in the migration of iodide ions, iodide vacancies, and Ag cations. Finally, an exhaustive model is proposed that explains the set and reset processes governing the first voltage cycle and the steady state, at different voltage ranges. In summary, this work offers a novel and thorough perspective of the complete resistive switching (RS) behavior in a MAPbI3/buffer/Ag memristor, supported by numerical simulations.

Tuneable quantised conductance memory states in TiO2 based resistive switching devices in crossbar geometry for high density memory applications

The tunability and controllability of conductance quantization mediated multilevel resistive switching (RS) memory devices, fabricated in crossbar geometry can be a promising alternative for boosting storage density. Here, we report fabrication of Cu/TiO2/Pt based RS devices in 8 × 8 crossbar geometry, which showed reliable bipolar RS operations. The crossbar devices showed excellent spatial and temporal variability, time retention and low switching voltage (<1 V) and current (∼100 μA). Furthermore, during the reset switching, highly repeatable and reliable integral and half-integral quantized conductance (QC) was observed. The observed QC phenomenon was attributed to the two dimensional confinement of electrons as lateral width of the conducting filament (CF) matches the fermi wavelength. The magnitude and number of the QC steps were found to increase from ∼2.5 to 12.5 and from 5 to 18, respectively by increasing the compliance current (I C) from 50 to 800 μA which also increased the diameter of the CF from ∼1.2 to 3.3 nm. The enhancement in both number and magnitude of QC states was explained using electrochemical dissolution mechanism of CF of varying diameter. A thicker CF, formed at higher I C, undergoes a gradual rupture during reset process yielding a greater number of QC steps compared to a thinner CF. The realisation of QC states in the crossbar Cu/TiO2/Pt device as well as I C mediated tunability of their magnitude and number may find applications in high-density resistive memory storage devices and neuromorphic computing.

Nonvolatile resistive switching in interface-dominated memristors utilizing two-dimensional Cs2Pb(SCN)2Br2 perovskite films

In this study, all-inorganic two-dimensional (2D) perovskite Cs2Pb(SCN)2Br2 was employed in a thin-film vertical structure prototype memristor. The device consisted of a Cs2Pb(SCN)2Br2 film prepared through solution approach, sandwiched between an Ag electrode and a TiO2/FTO substrate bottom electrode. Two types of resistive switching (RS) behaviors were observed within a single device at different temperatures. At room temperature, the dominant control mechanism was the interface Schottky barrier, whereas at higher temperatures, the primary driving force shifted to the conductive channel. The device has an on/off ratio exceeding 103 under the interface control mechanism. The migration of mobile bromine vacancies within the Cs2Pb(SCN)2Br2 film, whose concentration was enhanced by the infiltration and reaction of the Ag active electrode within the Cs2Pb(SCN)2Br2 film, is proposed to be the root cause for both types of RS characteristics. These findings offer insights into the potential application of 2D Cs2Pb(SCN)2Br2 perovskite in RS memory devices.

Study on multifunctional resistive switching and UV light detection characteristics in p-PEDOT:PSS/i-BFO/n-ZnO hybrid structures

The present research work based on the newly prepared organic-inorganic hybrid heterostructure will be exploited to develop a multifunctional device including non-volatile resistance switching memory devices, and ultraviolet (UV) light detection behavior for the first time based on p-PEDOT:PSS/i-BFO/n-ZnO junctions. Using a spray pyrolysis technique, n-type zinc oxide (ZnO) and i-type bismuth ferrite (BiFeO3) thin film layers were prepared on the clean glass substrates at temperature 673 K. Using a spin coater method, the p-PEDOT:PSS were grown upon a bismuth ferrite (BiFeO3) thin film with a constant spin velocity of 2000 rpm and heated at 363 K. The current (I)–voltage (V), photoresponse characteristics and resistive switching (RS) behavior of the fabricated p-PEDOT:PSS/i-BFO/n-ZnO hybrid devices were carried out. The device shows high photoresponsivity (R) of 0.001 285 A W−1 and fast photoresponse switching speed with the measured rise and fall time of 493 and 970 ms respectively. Based on the electrical properties, a conductive filament formation/rupture mechanism is proposed to explain the observed RS characteristics.

Memristive tonotopic mapping with volatile resistive switching memory devices

To reach the energy efficiency and the computing capability of biological neural networks, novel hardware systems and paradigms are required where the information needs to be processed in both spatial and temporal domains. Resistive switching memory (RRAM) devices appear as key enablers for the implementation of large-scale neuromorphic computing systems with high energy efficiency and extended scalability. Demonstrating a full set of spatiotemporal primitives with RRAM-based circuits remains an open challenge. By taking inspiration from the neurobiological processes in the human auditory systems, we develop neuromorphic circuits for memristive tonotopic mapping via volatile RRAM devices. Based on a generalized stochastic device-level approach, we demonstrate the main features of signal processing of cochlea, namely logarithmic integration and tonotopic mapping of signals. We also show that our tonotopic classification is suitable for speech recognition. These results support memristive devices for physical processing of temporal signals, thus paving the way for energy efficient, high density neuromorphic systems.

Ferroelectric polarization and conductance filament coupling for large window and high-reliability resistive memory and energy-efficient synaptic devices

Ferroelectric capacitors hold great promise for non-volatile memory applications. However, the challenge lies in fabricating resistive switching devices with a high on/off ratio, excellent non-volatility, and a simple manufacturing process. Here, a novel approach is introduced by demonstrating the efficacy of the coupling effect between ferroelectric polarization and oxygen vacancy-based conductive filaments in Hf0.5Zr0.5O2 (HZO) films for the creation of non-volatile resistive switching memory devices, achieving an impressive on/off ratio of 6.8 × 103 at +1.8 V. An in-depth exploration of the resistive switching mechanism is provided and subsequently the outstanding durability and retention characteristics of these devices for resistive switching is validated. Furthermore, the device’s capacity to emulate non-volatile synaptic functionalities is assessed. Our results reveal that under pulsed conditions of 1 V/–2 V with 1 µs pulses spaced 50 ms apart, the device can robustly achieve potentiation/depression synaptic plasticity, while exhibiting energy consumption (0.16 fJ for potentiation, 0.12 fJ for depression) reduced by 1–2 orders of magnitude compared to biological synapses. This work holds significant value as a reference for the fabrication of energy-efficient, non-volatile memory and synaptic devices.

Resistive Switching Property of Euforbia Cotinifolia Plant Extract for Potential Use in Eco-Friendly Memory Devices

Resistive switching memory devices based on organic materials are intriguing. These devices are biodegradable and nontoxic to living organisms. In this work, using euphorbia cotinifolia plant extract was investigated for its applicability as an active layer of a resistive switching memory device consisting of silver top electrode and indium-doped tin oxide bottom electrode. This study selected Euphorbia cotinifolia because it is a common, prolific and simple-to-grow plant in many South African homes. When the euphorbia cotinifolia plant is broken, an extract resembling milk is emitted. This extract was collected directly onto the bottom electrode, which was then dried at ambient temperature. For top electrode, silver paste was applied. The entire fabrication process was devoid of heat and electricity. The fabricated device showed impressive properties such as memory hysteresis with [Formula: see text], endurance of over [Formula: see text] write/erase cycles, and an impressive retention of [Formula: see text]. Therefore, this system may be a candidate for a nonvolatile and disposable memory device.

Self-Rectifying Gr/TMDC Heterostructures: Candidates for Resistive Switching Memory Devices

Self-Rectifying Gr/TMDC Heterostructures: Candidates for Resistive Switching Memory Devices

Solution-processed PEDOT: PSS/PVA polymer blend write-once-read-many memory devices

In this work, all-solution-processed resistive switching memory devices in a polymer blend are realised. The memory, in this work, is Write-Once-Read-Many memory (WORM). The polymer blend is the blend of Poly(3,4-ethylenedioxythiophene) Polystyrene Sulfonate (PEDOT: PSS) and Polyvinyl Alcohol (PVA). The devices can sustain 50 bending cycles at a bending radius of 0.5mm, while still able to maintain and perform memory functions. The mechanism of the switching can be attributed to electrochemical properties of the polymers. The migrations of polymers (PEDOT: PSS/PVA blend) and electrolysis of the absorbed water distort the conducting pathways and switch the state of the device from a low resistance state (LRS) to a high resistance state (HRS). The work may pave the way for future low cost flexible electronic memory devices. Flexible memory devices

Fractional Marcus-Hush-Chidsey-Yakopcic current-voltage model for redox-based resistive memory devices.

We propose a circuit-level model combining the Marcus-Hush-Chidsey electron current equation and the Yakopcic equation for the state variable for describing resistive switching memory devices of the structure metal-ionic conductor-metal. We extend the dynamics of the state variable originally described by a first-order time derivative by introducing a fractional derivative with an arbitrary order between zero and one. We show that the extended model fits with great fidelity the current-voltage characteristic data obtained on a Si electrochemical metallization memory device with Ag-Cu alloy.

Highly stable two-dimensional Ruddlesden-Popper perovskite-based resistive switching memory devices.

Resistive switching random-access memory (ReRAM) devices based on organic-inorganic halide perovskites (OIHPs) have emerged as a new class of data storage devices. Recently, two-dimensional (2D) OIHPs have attracted much attention for ReRAM applications because of their structural diversity and superior stability. Here, the RS characteristics of ReRAM devices fabricated utilizing pure 2D Ruddlesden-Popper (RP) perovskite crystals, namely (TEA)2PbBr4 and (TEA)2PbI4, are reported. The RS memory devices exhibit reliable and reproducible bipolar switching properties with high ON/OFF ratio (∼104), excellent data retention of over 104 s, and good endurance characteristics of 200 cycles. This study investigates temperature-dependent RS behaviors, elucidating the creation and annihilation of a conducting pathway in the presence of an external electric field. Additionally, the RS property of 2D RP perovskite-based memory devices is found to be retained over 45 days at ambient conditions under a relative humidity of 47% ± 4%. Our findings may accelerate the technological deployment of stable 2D perovskite-based RS memory devices for successful logic application.

Electrophysical properties, memristive and resistive switching of charged domain walls in lithium niobate

Charged domain walls (CDWs) in ferroelectric materials raise both fundamental and practical interest due to their electrophysical properties differing from bulk ones. On a microstructure level, CDWs in ferroelectrics are 2D defects separating regions with different spontaneous polarization vector directions. Screening of electric field of the CDW's bound ionic charges by mobile carriers leads to the formation of elongated narrow channels with an elevated conductivity in initially dielectric materials. Controlling the position and inclination angle of CDW relative to the spontaneous polarization direction, one can change its conductivity over a wide range thus providing good opportunities for developing memory devices, including neuromorphic systems. This review describes the state of art in the formation and application of CDWs in single crystal uniaxial ferroelectric lithium niobate (LiNbO3, LN), as resistive and memristive switching devices. The main CDWs formation methods in single crystal and thin-film LN have been described, and modern data have been presented on the electrophysical properties and electrical conductivity control methods of CDWs. Prospects of CDWs application in resistive and memristive switching memory devices have been discussed.

Flexible SnO2–MoS2 based memristive device exhibiting stable and enhanced memory phenomenon

Flexible non-volatile memory devices have been gaining interest in expanding the digital data storage world. Due to the burgeoning advancement in the healthcare industry, the Internet of Things, and wearable electronics, the demand for ultra-thin, low-power, and flexible memory is increasing. Further, the advancement of synthesis procedures for two-dimensional nanomaterials having better optical, electrical, and mechanical strength with flexibility has fuelled the flexible memory device area, as commonly used flash memory is approaching its physical limit. In this context, the present work reports the flexible resistive switching memory device based on pure molybdenum disulfide (MoS2) and tin oxide (SnO2) based nanocomposite powder synthesized using the simple hydrothermal process. The nanocomposite formation was characterized using x-ray diffraction and Raman spectroscopic techniques. The memory device was fabricated by spin-coating the pure MoS2, pure SnO2, and MoS2–SnO2 nanocomposite film over the ITO-PET flexible substrate. The device was completed by thermally evaporating the thin Al layer through a shadow mask. It was found that MoS2–SnO2 based memory devices exhibited improved switching performance having a higher I ON/I OFF ratio, and lower switching voltage in comparison to pure MoS2 and pure SnO2-based devices (I ON/I OFF ratio ∼100, V = 0.5 V). Furthermore, to check the stability and cyclic performance of the fabricated device, the retention and endurance test was also performed, and the MoS2–SnO2 device retained the HRS and LRS states up to 2 × 103s and showed stable performance up to 100 switching cycles without much degradation, respectively. It should be mentioned that the presently proposed ReRAM device based on SnO2 and MoS2 with flexible and low-power features had excellent potential for use in the wearable device industry.

Resistive Switching in Bigraphene/Diamane Nanostructures Formed on a La3Ga5SiO14 Substrate Using Electron Beam Irradiation.

Memristors, resistive switching memory devices, play a crucial role in the energy-efficient implementation of artificial intelligence. This study investigates resistive switching behavior in a lateral 2D composite structure composed of bilayer graphene and 2D diamond (diamane) nanostructures formed using electron beam irradiation. The resulting bigraphene/diamane structure exhibits nonlinear charge carrier transport behavior and a significant increase in resistance. It is shown that the resistive switching of the nanostructure is well controlled using bias voltage. The impact of an electrical field on the bonding of diamane-stabilizing functional groups is investigated. By subjecting the lateral bigraphene/diamane/bigraphene nanostructure to a sufficiently strong electric field, the migration of hydrogen ions and/or oxygen-related groups located on one or both sides of the nanostructure can occur. This process leads to the disruption of sp3 carbon bonds, restoring the high conductivity of bigraphene.

Self‐Assembled Lanthanum Oxide Nanoflakes by Electrodeposition Technique for Resistive Switching Memory and Artificial Synaptic Devices (Small 46/2023)

Self‐Assembled Lanthanum Oxide Nanoflakes by Electrodeposition Technique for Resistive Switching Memory and Artificial Synaptic Devices (Small 46/2023)