Reliability Of Anisotropic Conductive Film Joints Research Articles

Optimization and reliability evaluation of COG bonding process

In order to assemble a driver IC onto a LCD glass panel, Chip on glass (COG) bonding technology using Anisotropic conductive film (ACF) has been widely implemented. The key process parameters in the technology are the temperature, pressure and time during the thermo-compression bonding. These factors mainly affect the quality of the assembled ACF joint being represented by the contact resistance and adhesion strength. This study purposes to obtain the optimal process conditions for high reliability of the ACF joint. In order to determine the optimal condition, the experiments based on the response surface methodology were designed. Based on the experiments and statistical analysis, the empirical model of second-order polynomials approximating the relationships between the process conditions and the response variables of contact resistance and adhesion strength were obtained. The optimal process condition to lead lower contact resistance and higher adhesion strength of the ACF joint was also calculated from the relationships. The optimization was verified through the bonding experiments conducted under the derived optimal process condition. In addition, the reliability of the ACF joints according to the variation of the process conditions was evaluated in high temperature and humidity environment (85°C/85%RH). Consequently, it was shown that the reliability of ACF joints assembled under the optimal process conditions was superior to others after the 85°C/85%RH tests.

Effects of Bonding Pressures and Bonding Temperatures on Solder Joint Morphology and Reliability of Solder ACF Bonding

In this paper, in order to improve the reliability of anisotropic conductive film (ACF) interconnections, solder ACF joints were investigated in terms of solder joint morphology. ACFs are film-type interconnection adhesive materials that consist of polymer adhesive resins and randomly dispersed conductive particles. Recently, in order to obtain high reliability of ACF joints, solder ACFs that use solder particles as conductive particles of ACFs have been introduced combined with an ultrasonic bonding method. However, further researches are needed in the area of crack initiation and the propagation of solder ACF joints at high temperature and high humidity conditions due to the stress generated by hygroscopic expansion of ACF resin. Therefore, in order to solve the crack initiation of solder ACF joints, solder ACF joint morphology should be controlled and optimized to minimize the solder crack-related reliability problems. In this paper, solder ACF joint reliability was investigated depending on the solder morphologies of ACF joints bonded with various bonding pressures and temperatures. According to the results, as bonding pressure increased from 2 to 6 MPa, aspect ratio (joint diameter/joint gap) increased due to the increased joint area and decreased joint gap. In the pressure cooker test (PCT) reliability tests, as solder aspect ratio increased, electrical resistances were more stable after 60 h of the tests due to higher joint strength. In the target bonding temperature profile of 250 °C, solder joints showed a concave shape. However, joints bonded at in the target bonding temperature profile of 200 °C showed a convex shape. It is mainly due to the lower degree of cure of resin when ACF temperature reached to solder Melting Point (MP) in the target bonding temperature profile of 250 °C compared with that in the target bonding temperature profile of 200°, because ACF temperature reached to solder MP in shorter time in the target bonding temperature profile of 250 °C. Concave-shaped solder joints showed higher PCT reliability than the convex-shaped solder joints due to the lower stress concentration. These results indicate that solder ACF joint morphology was a significantly important factor for highly reliable solder ACF joints in high temperature and high humidity reliability conditions.

Effects of Conductive Particles on the Electrical Stability and Reliability of Anisotropic Conductive Film Chip-on-Board Interconnections

The effects of conductive particles on the electrical stability and reliability of anisotropic conductive film (ACF) joints for chip-on-board applications were investigated. In this paper, two types of conductive particles were prepared. One was a conventional Ni/Au-coated polymer ball, and the other was a Ni/Au-coated polymer ball with Ni/Au-projections. According to the results of a nano-indentation experiment of a conductive particle, the elastic recovery of a single conductive particle decreased as the applied load and the deformation of the conductive particle increased. The evaluated conductive particles which had the same polymer core showed the similar load-deformation behaviors regardless of the existence of Ni/Au-projections. The contact resistances of ACF joints using each conductive particle as a function of bonding pressure were measured, and the results showed that the contact resistances of ACF joints with the metal-projection-type conductive particles were lower and more stable than those with the conventional conductive particles. Especially at lower bonding pressure, ACF joints with the metal-projection-type conductive particles were much more stable and had lower contact resistances than the conventional ACF joints. According to the results of thermal cycling (T/C) reliability test, the metal-projection-type conductive particles also enhanced T/C reliability of ACF joints when compared with the conventional conductive particles.

Study of the Formation of Bubbles in Rigid Substrate-Flexible Substrate Bonding Using Anisotropic Conductive Films and the Bubble Effects on Anisotropic Conductive Film Joint Reliability

The formation of process-related bubbles that become entrapped inside the anisotropic conductive film (ACF) layer during bonding processes remains an issue. The formation of these bubbles is strongly influenced by the process variables, such as bonding pressure and bonding temperature. Therefore, bonding process variables of bonding temperature, bonding pressure, and type of flexible substrate (FS) were changed in order to investigate the effects of the changes as they concern the formation of bubbles. According to the results, the tendency toward bubble formation was closely related to these three factors. The bubble area increased as the bonding temperature increased. Moreover, the shape and tendency of bubbles coincided with temperature distribution in␣the ACF layer. Two different types of FS, each with different surface roughnesses and energies, were used. The bubbles formed only on the FS with the larger roughness and lower surface energy. According to the results from a surface energy measurement of FS types using goniometry, a FS with a higher surface energy is favorable for a bubble-free assembly, as the higher surface energy provides better wettability. In addition, in order to investigate the effect of bubbles on the reliability of ACF joints, the pressure cooker test (PCT) was performed, and all samples with bubbles electrically failed after 72 h of a PCT, as the process-related bubbles provided a moisture penetration path and entrapment site for moisture. However, all type 1 test vehicles (TVs) survived even after 120 h of a PCT. Therefore, Ar and O2 plasma treatments were performed on the FS with the lower surface energy in order to improve the surface energies and wettability. Following this, the bubbles were successfully removed at rigid substrate (RS)–FS bonding joints using ACFs.