Here we propose a thin-film structure that produces bright and angle robust reflective structural colors based on spectral selective absorption mechanism. Through numerical analysis, the optical constants n and k of the lossy metal films were calculated under ideal absorption conditions, and the Si–Al (90%) films with a close refractive index was successfully prepared. Amorphous silicon, SiOX, and Si–Al (90%) films were constructed into appropriate thin film structures, which achieve optimal optical performance, broadband absorption, and excellent angle insensitivity. Using a series of silicon-based films, dual-frequency and broadband absorption can be achieved while minimizing the inevitable absorption losses at the peak wavelengths. These red, green, and blue reflective colors achieve a high level of reflectance with 96%, 83%, and 91% at resonance. With its excellent color properties, safety, and low fabrication costs, this scheme is suitable for wide-ranging applications, including display, color decoration, counterfeit detection, etc.