Diffuse reflectance standards of known hemispherical reflectance Rh are widely used in optical and imaging studies. We have developed a stochastic surface model to investigate light reflection and roughness dependence. Through Monte Carlo simulations, the angle-resolved distributions of reflected light have been modeled as the results of local surface reflection with a constant reflectance Rs representing the overall ability of a reflectance standard. The surface was modeled by an ensemble of random Gaussian surface profiles parameterized by a mean surface height δ and transverse correlation length a. By decreasing δ / a, the calculated reflected light distributions were found to transit from Lambertian to specular reflection regime. Reflected light distributions were measured with three standards by nominal reflectance Rh valued at 10%, 80%, and 99%. The calculated results agree well with the measured data in their angular distributions at different incident angles by setting Rs = Rh and δ = a = 3.5 μm.
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