To integrate plasmonic devices into industry, it is essential to develop scalable and CMOS compatible plasmonic materials. In this work, we report high plasmonic quality titanium nitride (TiN) on c-plane sapphire grown by plasma-enhanced atomic layer deposition. TiN with low losses, high metallicity, and a plasma frequency below 500 nm was achieved at temperatures less than 500 °C by exploring the effects of chemisorption time, substrate temperature, and plasma exposure time on the material properties. A reduction in chemisorption time mitigates premature precursor decomposition at TS > 375 °C, and a trade-off between reduced impurity concentration and structural degradation caused by plasma bombardment is achieved for 25 s plasma exposure. 85 nm thick TiN films grown at a substrate temperature of 450 °C, compatible with CMOS processes, with 0.5 s chemisorption time and 25 s plasma exposure exhibited a high plasmonic figure of merit (|ε′/ε′′|) of 2.8 and resistivity of 31μΩcm. As a result of the improved quality, subwavelength apertures were fabricated in the TiN thin films and are shown to exhibit extraordinary transmission.